CY7C1441KV33 datasheet(21/32 Pages) CYPRESS

No. de pieza	CY7C1441KV33

Descripción Electrónicos	36-Mbit (1M 횞 36/2M 횞 18) Flow-Through SRAM (With ECC)

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Fabricante Electrónico	CYPRESS [Cypress Semiconductor]

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CY7C1441KV33

CY7C1443KV33

CY7C1441KVE33

Document Number: 001-66677 Rev. *I

Page 21 of 32

Capacitance

Parameter [17]

Description

Test Conditions

100-pin TQFP

Max.

165-ball FBGA

Max.

Unit

CIN

Input capacitance

TA = 25C, f = 1 MHz,

VDD = 3.3V, VDDQ = 2.5 V

5

pF

CCLK

Clock input capacitance

5

pF

CIO

Input/output capacitance

5

pF

Thermal Resistance

Parameter [17]

Description

Test Conditions

100-pin TQFP

Package

165-ball FBGA

Package

Unit

JA

Thermal resistance

(junction to ambient)

Test conditions follow

standard test methods and

procedures for measuring

thermal impedance, per

EIA/JESD51.

With Still Air (0 m/s)

35.36

14.24

°C/W

With Air Flow (1 m/s)

31.30

12.47

°C/W

With Air Flow (3 m/s)

28.86

11.40

°C/W

JC

Thermal resistance

(junction to case)

–7.52

3.92

°C/W

JB

Thermal resistance

(junction to board)

28.89

7.19

°C/W

AC Test Loads and Waveforms

Figure 3. AC Test Loads and Waveforms

OUTPUT

R = 317



R = 351



5pF

INCLUDING

JIG AND

SCOPE

(a)

(b)

OUTPUT

RL = 50

Z0 = 50

VT = 1.5V

3.3V

ALL INPUT PULSES

VDDQ

GND

90%

10%

90%

10%

2 V/ns

 1 ns

(c)

OUTPUT

R = 1667



R = 1538



5pF

INCLUDING

JIG AND

SCOPE

(a)

(b)

OUTPUT

RL = 50

Z0 = 50

VT = 1.25V

2.5V

ALL INPUT PULSES

VDDQ

GND

90%

10%

90%

10%

2 V/ns

 1 ns

(c)

3.3V I/O Test Load

2.5V I/O Test Load

Note

17. Tested initially and after any design or process change that may affect these parameters.

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CY7C1441KV33 Datasheet(PDF) 21 Page - Cypress Semiconductor

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