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NCV8660B Datasheet(PDF) 3 Page - ON Semiconductor

No. de pieza NCV8660B
Descripción Electrónicos  Very Low Iq LD0 150 mA Regulator Delay Time Select
Download  14 Pages
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Fabricante Electrónico  ONSEMI [ON Semiconductor]
Página de inicio  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

NCV8660B Datasheet(HTML) 3 Page - ON Semiconductor

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NCV8660B
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3
ABSOLUTE MAXIMUM RATINGS
Rating
Symbol
Min
Max
Unit
Input Voltage (IN)
VIN
−0.3
40
V
Input Current
IIN
−1.0
mA
Output Voltage (OUT)
DC
Transient, t < 10 s (Note 1)
VOUT
−0.3
−0.3
5.5
16
V
Output Current (OUT)
IOUT
−1.0
Current
Limited
mA
Storage Temperature Range
TSTG
−55
150
°C
DT (Reset Delay Time Select) Voltage (Note 2)
VDT
−0.3
16
V
DT (Reset Delay Time Select) Current (Note 2)
IDT
−1.0
1.0
mA
RO (Reset Output) Voltage
DC
Transient, t < 10 s
VRO
−0.3
−0.3
5.5
16
V
RO (Reset Output) Current
IRO
−1.0
1.0
mA
ESD CAPABILITY
ESD Capability, Human Body Model (Note 3)
ESDHB
−2.0
2.0
kV
ESD Capability, Machine Model (Note 3)
ESDMM
−200
200
V
ESD Capability, Charged Device Model (Note 3)
ESDCDM
−1.0
1.0
kV
THERMAL RESISTANCE
Junction−to−Case (Note 4)
DPAK 5
RqJC
15
°C/W
Junction−to−Ambient (Note 4)
DPAK 5
RqJA
66
°C/W
Junction−to−Tab (Note 4)
DPAK 5
RqJT
4.0
°C/W
Junction−to−Ambient (Note 4)
SOIC−8 FUSED
RqJA
104
°C/W
Junction−to−Lead (pin 6) (Note 4)
SOIC−8 FUSED
RqJT
33
°C/W
LEAD SOLDERING TEMPERATURE AND MSL
Moisture Sensitivity Level
DPAK 5
SOIC−8 FUSED
MSL
1
3
Lead Temperature Soldering: SMD style only, Reflow (Note 5)
Pb−Free Part 60 − 150 sec above 217
°C, 40 sec max at peak
SLD
265 peak
°C
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. The output voltage must not exceed the input voltage.
2. External resistor required to minimize current to less than 1 mA when the control voltage is above 16 V.
3. This device series incorporates ESD protection and is tested by the following methods:
ESD HBM tested per AEC−Q100−002 (EIA/JESD22−A114)
ESD MM tested per AEC−Q100−003 (EIA/JESD22−A115)
ESD CDM tested per EIA/JESD22/C101, Field Induced Charge Model
4. Values represented typical steady−state thermal performance on 1 oz. copper FR4 PCB with 1 in2 copper area.
5. Per IPC / JEDEC J−STD−020C.
OPERATING RANGE
Pin Symbol, Parameter
Symbol
Min
Max
Unit
VIN, Input Voltage Operating Range
VIN
4.5
40
V
Junction Temperature Range
TJ
−40
150
°C


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