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CAT1025RI-30TE13 Datasheet(PDF) 6 Page - Catalyst Semiconductor |
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CAT1025RI-30TE13 Datasheet(HTML) 6 Page - Catalyst Semiconductor |
6 / 20 page 6 CAT1024, CAT1025 Doc. No. 3008, Rev. M RESET CIRCUIT AC CHARACTERISTICS Notes: 1. Test Conditions according to “AC Test Conditions” table. 2. Power-up, Input Reference Voltage VCC = VTH, Reset Output Reference Voltage and Load according to “AC Test Conditions” Table 3. Power-Down, Input Reference Voltage VCC = VTH, Reset Output Reference Voltage and Load according to “AC Test Conditions” Table 4. VCC Glitch Reference Voltage = VTHmin; Based on characterization data 5. This parameter is characterized initially and after a design or process change that affects the parameter. Not 100% tested. 6. tPUR and tPUW are the delays required from the time VCC is stable until the specified memory operation can be initiated. 7. Latch-up protection is provided for stresses up to 100mA on input and output pins from -1V to VCC + 1V. AC TEST CONDITIONS l o b m y Sr e t e m a r a P t s e T s n o i t i d n o C n i Mp y Tx a Ms t i n U t T S R U P t u o e m i T t e s e R2 e t o N0 3 10 0 20 7 2s m t D P R V H T y a l e D t u p t u O T E S E R o t3 e t o N5 s µ t H C T I L G V C C h t d i W e s l u P t c e j e R h c ti l G5 , 4 e t o N0 3s n h c ti l G R My ti n u m m I h c ti l G t e s e R l a u n a M1 e t o N0 0 1s n t W R M h t d i W e s l u P R M1 e t o N5 s µ t D R M y a l e D t u p t u O T E S E R o t t u p n I R M1 e t o N1 s µ G N I M I T P U - R E W O P 6 , 5 l o b m y Sr e t e m a r a P t s e T s n o i t i d n o C n i Mp y Tx a Ms t i n U t R U P n o it a r e p O d a e R o t p U - r e w o P 0 7 2s m t W U P n o it a r e p O e ti r W o t p U - r e w o P 0 7 2s m r e t e m a r a Ps n o i t i d n o C t s e T s e g a t l o V e s l u P t u p n IV 2 . 0 C C V 8 . 0 o t C C s e m i T ll a F d n a e s i R t u p n Is n 0 1 s e g a t l o V e c n e r e f e R t u p n IV 3 . 0 C C V 7 . 0 , C C s e g a t l o V e c n e r e f e R t u p t u OV 5 . 0 C C d a o L t u p t u O I : e c r u o S t n e r r u C L O ; A m 3 = C L F p 0 0 1 = RELIABILITY CHARACTERISTICS Symbol Parameter Reference Test Method Min Max Units NEND(5) Endurance MIL-STD-883, Test Method 1033 1,000,000 Cycles/Byte TDR(5) Data Retention MIL-STD-883, Test Method 1008 100 Years VZAP(5) ESD Susceptibility MIL-STD-883, Test Method 3015 2000 Volts ILTH(5)(7) Latch-Up JEDEC Standard 17 100 mA |
Número de pieza similar - CAT1025RI-30TE13 |
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Descripción similar - CAT1025RI-30TE13 |
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