Philips Semiconductors

Product specification

74ABT16273

74ABTH16273

16-bit D-type flip-flop

1998 Feb 27

5

DC ELECTRICAL CHARACTERISTICS

LIMITS

SYMBOL

PARAMETER

TEST CONDITIONS

Temp = +25

°C

Temp = -40

°C

to +85

°C

UNIT

MIN

TYP

MAX

MIN

MAX

Input clamp voltage

0.9

–1.2

–1.2

V

2.5

2.9

2.5

High-level output voltage

3.0

3.4

3.0

V

2.0

2.4

2.0

Low-level output voltage

0.42

0.55

0.55

Power-up output

0.13

0.55

0.55

V

Input leakage current

I

Input leakage current

±01

±1

±1

µA

g

74ABT16273

±0.1

±1

±1

µA

I

74ABT16273

CC

I

CC

µ

Input leakage current

Control

pins

±0.01

±1

±1

µA

In ut leakage current

74ABTH16273

Data pins

0.01

1

1

µA

Data pins

–2

–3

–5

µA

B

H ld

t i

35

35

74ABTH16273

–75

–75

µA

±800

Power-off leakage

current

±5.0

±100

±100

µA

–50

–70

–180

–50

–180

mA

Output High leakage

current

5.0

50

50

µA

Quiescent supply current

0.2

1

1

mA

Quiescent supply current

8

19

19

mA

Additional supply current

74ABT16273

5

100

100

µA

Additional supply current

74ABTH16273

0.2

1

1

mA

NOTES:

1. Not more than one output should be tested at a time, and the duration of the test should not exceed one second.

2. This is the increase in supply current for each input at 3.4V.

3. For valid test results, data must not be loaded into the flip-flops (or latches) after applying the power.

4. This is the bus hold overdrive current required to force the input to the opposite logic state.

AC CHARACTERISTICS

LIMITS

SYMBOL

PARAMETER

WAVEFORM

UNIT

MIN

TYP

MAX

MIN

MAX

Propagation delay

nCP to nQx

1

1.5

1.2

2.5

2.0

3.4

2.7

1.5

1.2

4.0

3.0

ns

Propagation delay

nMR to nQx

2

1.9

3.7

4.3

1.9

5.3

ns

Maximum clock frequency

1

150

240

150

MHz