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74ABTL3205 Datasheet(PDF) 7 Page - NXP Semiconductors |
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74ABTL3205 Datasheet(HTML) 7 Page - NXP Semiconductors |
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7 / 14 page  Philips Semiconductors Product specification 74ABTL3205 10-bit BTL transceiver with registers 1995 Jun 16 7 DC ELECTRICAL CHARACTERISTICS Over recommended operating free-air temperature range unless otherwise noted. SYMBOL PARAMETER TEST CONDITIONS1 LIMITS UNIT SYMBOL PARAMETER TEST CONDITIONS1 MIN TYP2 MAX UNIT IOH High level output current BTL VCC = MAX, VIL = MAX, VIH = MIN, VOH = 1.9V 0.5 100 µA IOFF Power-off output current BTL VCC = 0.0V, VIL = MAX, VIH = MIN, VOH = 1.9V 10 100 µA VCC = MIN, VIL = MAX,4 VIH = MIN, IOH = –3mA 2.5 2.85 3.4 V VOH High-level output voltage TTL VCC = MIN to MAX, 4 VIL = MAX, VIH = MIN, IOH = –10µA VCC – 1.1 V TTL VCC = MIN, VIL = MAX, VIH = MIN, IOL = 24mA 0.35 0.5 V VOL Low-level output voltage BTL VCC = MIN, VIL = MAX, VIH = MIN, IOL = 100mA 0.75 1.0 1.10 V BTL VCC = MIN, VIL = MAX, VIH = MIN, IOL = 4mA 0.5 0.7 V VIK Input clamp voltage TTL VCC = MIN, II = IIK 0.8 –1.2 V VIK In ut clam voltage BTL VCC = MIN, II = –18mA 0.8 –1.2 V II Input current at maximum input voltage TTL VCC = MAX, VI = 0.5V or 5.5V 0.1 ±50 µΑ I Hi h l l i t t TTL VCC = MAX, VI = 2.7V, Bn = AIn = 0V 0.1 20 µΑ IIH High-level input current BTL VCC = MAX, VI = 1.9V 0.1 100 µΑ BTL VCC = MAX, VI = 3.5V5 100 mA IIL Low-level input current TTL VCC = MAX, VI = 0.5V 0.1 –20 µΑ IIL Low-level in ut current BTL VCC = MAX, VI = 0.75V 0.1 –100 µΑ IOZH Off-state output current TTL VCC = MAX, VO = 2.7V 0.1 50 µΑ IOZL Off-state output current TTL VCC = MAX, VO = 0.5V 20 –50 µΑ IOS Short-circuit output current3 TTL VCC = MAX, VO = 0.0V –60 130 –150 mA Recmode Low Tranmode Low VCC = MAX 1 3 mA Recmode Low Tranmode High VCC = MAX Mode = Low 7 12 mA ICC Supply current (total) Recmode Low Tranmode High VCC = MAX Mode = High 13 21 mA Recmode High Tranmode Low VCC = MAX 18 25 mA Recmode High Tranmode High VCC = MAX 29 43 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. 4. Due to test equipment limitations, actual test conditions are VIH = 1.8V and VIL = 1.3V for the B side. 5. For B port input voltage between 3 and 5 volts IIH will be greater than 100µA, but the parts will continue to function normally. TTL signals CLKin, CLK-1/CLK-OUT, CLK-2/FP-OUT, /FP-IN, /PARITY t,A0..A7, OEB, MASTER/SLAVE, MODE, OEA1, OEA2 BTL signals CLK1BTL, CLK2BTL, B0..B7 |
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