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74F564 Datasheet(PDF) 4 Page - NXP Semiconductors |
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74F564 Datasheet(HTML) 4 Page - NXP Semiconductors |
4 / 10 page Philips Semiconductors Product specification 74F564 Octal D flip-flop (3-State) 1996 Jan 05 4 RECOMMENDED OPERATING CONDITIONS SYMBOL PARAMETER LIMITS UNIT SYMBOL PARAMETER MIN NOM MAX UNIT VCC Supply voltage 4.5 5.0 5.5 V VIH High-level input voltage 2.0 V VIL Low-level input voltage 0.8 V IIK Input clamp current –18 mA IOH High-level output current –3 mA IOL Low-level output current 24 mA Tamb Operating free-air temperature range 0 70 °C DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) NO TAG LIMITS SYMBOL PARAMETER TEST CONDITIONSNO TAG MIN TYP NO TAG MAX UNIT VO High level output voltage VCC = MIN, VIL = MAX, ±10%VCC 2.4 V VOH High-level output voltage VCC MIN, VIL MAX, VIH = MIN, IOH = MAX ±5%VCC 2.7 3.4 V VO Low level output voltage VCC = MIN, VIL = MAX, ±10%VCC 0.35 0.50 V VOL Low-level output voltage VCC MIN, VIL MAX, VIH = MIN, IOL = MAX ±5%VCC 0.35 0.50 V VIK Input clamp voltage VCC = MIN, II = IIK –0.73 –1.2 V II Input current at maximum input voltage VCC = MAX, VI = 7.0V 100 µA IIH High-level input current VCC = MAX, VI = 2.7V 20 µA IIL Low-level input current VCC = MAX, VI = 0.5V –0.6 mA IOZH Off-state output current, High-level voltage applied VCC = MAX, VO = 2.7V 50 µA IOZL Off-state output current, Low-level voltage applied VCC = MAX, VO = 0.5V –50 µA IOS Short-circuit output currentNO TAG VCC = MAX –60 –150 mA ICCH 45 65 mA ICC Supply current (total) ICCL VCC = MAX 50 75 mA ICCZ 55 80 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. |
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