Philips Semiconductors FAST Products

Product specification

74F8960/74F8961

Octal latched bidirectional Futurebus transceivers

(3-State + open-collector)

December 19, 1990

11

AC WAVEFORMS

VM

VM

VM

VM

Waveform 1. Propagation delay for data to output

Waveform 3. Data setup and hold times and LE pulse width

Waveform 4. 3–state output enable time to high level

and output disable time from high level

Waveform 5. 3-state output enable time to low level

and output disable time from low level

LE

VM

VM

VM

VM

VM

VM

ts(L)

ts(H)

th(L)

th(H)

VM

VM

VM

tPHZ

tPZH

VOH -0.3V

0V

VM

VM

VM

tPLZ

tPZL

VOL +0.3V

OEA

An

OEA

An

An

An, Bn

An, Bn, OEBn

tPLH

tPHL

VM

tw(L)

VM

VM

VM

VM

Waveform 2. Propagation delay for data to output

An, Bn

An, Bn, OEBn

tPHL

tPLH

NOTES:

2. The shaded areas indicate when the input is permitted to change for predictable output performance.

TEST CIRCUITS AND WAVEFORMS

CD

tw

90%

VM

10%

90%

VM

10%

90%

VM

10%

90%

VM

10%

NEGATIVE

PULSE

POSITIVE

PULSE

tw

AMP (V)

Low V

Low V

tTHL (tf )

INPUT PULSE REQUIREMENTS

rep. rate

Input pulse definition

VCC

family

74F

D.U.T.

PULSE

GENERATOR

RL

CL

RT

VIN

VOUT

Test circuit for 3–state outputs on A port

DEFINITIONS:

tTHL (tf )

tTLH (tr )

tTLH (tr )

AMP (V)

amplitude

RL

7.0V

VCC

D.U.T.

PULSE

GENERATOR

RT

VIN

VOUT

Test circuit for outputs on B port

RU

7.0V

Low V

SWITCH POSITION

TEST

SWITCH

closed

open

All other

A port

3.0V

0.0V

1.5V

1MHz

500ns

2.5ns

2.5ns

B port

3.0V

1.0V

1.5V

1MHz

500ns

4.0ns

4.0ns