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AD5648BRUZ-2 Datasheet(PDF) 11 Page - Analog Devices

No. de pieza AD5648BRUZ-2
Descripción Electrónicos  Octal, 12-14-16 Bit Dac with 10ppm/째C Max On-Chip Reference in 14-Lead TSSOP
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AD5648BRUZ-2 Datasheet(HTML) 11 Page - Analog Devices

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Preliminary Technical Data
AD5628/AD5648/AD5668
Rev. PrA| Page 11 of 24
ABSOLUTE MAXIMUM RATINGS
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those listed in the operational sections
of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
(TA = +25°C unless otherwise noted)
Parameter
Rating
VDD to GND
-0.3 V to +7 V
Digital Input Voltage to GND
-0.3 V to VDD + 0.3 V
VOUT to GND
-0.3 V to VDD + 0.3 V
Operating Temperature Range
Industrial (B Version)
-40°C to +105°C
Storage Temperature Range
-65°C to +150°C
Junction Temperature (TJ Max)
+150°C
TSSOP Package
Power Dissipation
(TJ Max-TA)/θJA
θJA Thermal Impedance
150.4°C/W
Lead Temperature, Soldering
Vapor Phase (60 sec)
+215°C
Infrared (15 sec)
+220°C
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the
human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
TERMINOLOGY
Relative Accuracy
For the DAC, relative accuracy or Integral Nonlinearity (INL) is a
measure of the maximum deviation, in LSBs, from a straight line
passing through the endpoints of the DAC transfer function. A
typical INL vs. code plot can be seen in Figure 2.
Differential Nonlinearity
Differential Nonlinearity (DNL) is the difference between the
measured change and the ideal 1 LSB change between any two
adjacent codes. A specified differential nonlinearity of ±1 LSB
maximum ensures monotonicity. This DAC is guaranteed
monotonic by design. A typical DNL vs. code plot can be seen in
Figure 3.
Offset Error
Offset error is a measure of the difference between VOUT
(actual) and VOUT (ideal) expressed in mV in the linear
region of the transfer function. Offset error is measured on
the AD5668 with Code ??? loaded into the DAC register.
This is a measure of the offset error of the DAC and the output
amplifier (see Figures 2 and 3). It can be negative or positive, and is
expressed in mV.
Zero-Code Error
Zero-code error is a measure of the output error when zero code
(0000Hex) is loaded to the DAC register. Ideally the output should
be 0 V. The zero-code error is always positive in the AD56x8
because the output of the DAC cannot go below 0 V. It is due to a
combination of the offset errors in the DAC and output amplifier.
Zero-code error is expressed in mV. A plot of zero-code error vs.
temperature can be seen in Figure 6.
Gain Error
This is a measure of the span error of the DAC. It is the deviation
in slope of the DAC transfer characteristic from ideal expressed as
a percent of the full-scale range.
Zero-Code Error Drift
This is a measure of the change in zero-code error with a change in
temperature. It is expressed in µV/°C.
Gain Error Drift
This is a measure of the change in gain error with changes in
temperature. It is expressed in (ppm of full-scale range)/°C.
Full-Scale Error
Full-scale error is a measure of the output error when full-scale
code (FFFF Hex) is loaded to the DAC register. Ideally the output
should be VDD – 1 LSB. Full-scale error is expressed in percent of
full-scale range. A plot of full-scale error vs. temperature can be
seen in Figure 6.
Total Unadjusted Error
Total Unadjusted Error (TUE) is a measure of the output error


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