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MC100E101FNR2G Datasheet(PDF) 4 Page - ON Semiconductor |
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MC100E101FNR2G Datasheet(HTML) 4 Page - ON Semiconductor |
4 / 7 page MC10E101, MC100E101 http://onsemi.com 4 Table 6. 100E SERIES NECL DC CHARACTERISTICS VCCx = 0.0 V; VEE = −5.0 V (Note 7) Symbol Characteristic −40°C 25°C 85°C Unit Min Typ Max Min Typ Max Min Typ Max IEE Power Supply Current 30 36 30 36 35 42 mA VOH Output HIGH Voltage (Note 8) −1025 −950 −880 −1025 −950 −880 −1025 −950 −880 mV VOL Output LOW Voltage (Note 8) −1810 −1705 −1620 −1810 −1745 −1620 −1810 −1740 −1620 mV VIH Input HIGH Voltage −1165 −1025 −880 −1165 −1025 −880 −1165 −1025 −880 mV VIL Input LOW Voltage −1810 −1645 −1475 −1810 −1645 −1475 −1810 −1645 −1475 mV IIH Input HIGH Current 150 150 150 mA IIL Input LOW Current 0.5 0.3 0.5 0.25 0.5 0.2 mA NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit values are applied individually under normal operating conditions and not valid simultaneously. 7. Input and output parameters vary 1:1 with VCC. VEE can vary −0.46 V / +0.8 V. 8. Outputs are terminated through a 50 W resistor to VCC − 2.0 V. Table 7. AC CHARACTERISTICS VCCx= 5.0 V; VEE = 0.0 V or VCCx = 0.0 V; VEE = −5.0 V (Note 9) Symbol Characteristic −40°C 25°C 85°C Unit Min Typ Max Min Typ Max Min Typ Max fMAX Maximum Toggle Frequency 700 700 700 MHz tPLH tPHL Propagation Delay to Output D to Q 300 450 600 300 450 600 300 450 600 ps tSKEW Within-Device Skew (Note 10) Within-Gate Skew (Note 11) 50 25 50 25 50 25 ps tJITTER Random Clock Jitter (RMS) < 1 < 1 < 1 ps tr tf Rise/Fall Time (20 - 80%) 275 380 575 300 380 575 275 380 575 ps NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit values are applied individually under normal operating conditions and not valid simultaneously. 9. 10 Series: VEE can vary −0.46 V / +0.06 V. 100 Series: VEE can vary −0.46 V / +0.8 V. 10.Within-device skew is defined as identical transitions on similar paths through a device. 11. Within-gate skew is defined as the variation in propagation delays of a gate when driven from its different inputs. Figure 3. Typical Termination for Output Driver and Device Evaluation (See Application Note AND8020/D − Termination of ECL Logic Devices.) Driver Device Receiver Device QD Q D Zo = 50 W Zo = 50 W 50 W 50 W VTT VTT = VCC − 2.0 V |
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