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CAT25C04 Datasheet(PDF) 2 Page - Catalyst Semiconductor |
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CAT25C04 Datasheet(HTML) 2 Page - Catalyst Semiconductor |
2 / 15 page Discontinued Parts 2 CAT25C01, CAT25C02, CAT25C04 Doc. No. 1105, Rev. B © 2005 by Catalyst Semiconductor, Inc. Characteristics subject to change without notice ABSOLUTE MAXIMUM RATINGS* Storage Temperature -65 °C to +150°C Voltage on Any Pin with Respect to Ground(1) -0.5 V to +6.5 V * Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability. RELIABILITY CHARACTERISTICS(2) Symbol Parameter Min Units NEND(*) Endurance 1,000,000 Program/ Erase Cycles TDR Data Retention 100 Years (*) Page Mode, VCC = 5 V, 25 °C D.C. OPERATING CHARACTERISTICS VCC = 1.8 V to 5.5 V, TA = -40 °C to 85°C, unless otherwise specified. Symbol Parameter Test Conditions Min Max Units ICC Supply Current Read or Write at 5 MHz 1 mA ISB Standby Current All I/O Pins at GND or VCC,2 µA CS = VCC IL I/O Pin Leakage Pin at GND or VCC 2 µA VIL Input Low Voltage -0.5 VCC x 0.3 V VIH Input High Voltage VCC x 0.7 VCC + 0.5 V VOL1 Output Low Voltage VCC > 2.5 V, IOL = 3.0 mA 0.4 V VOL2 Output Low Voltage VCC > 1.8 V, IOL = 1.0 mA 0.2 V PIN IMPEDANCE CHARACTERISTICS TA = 25 °C, f = 1 MHz, VCC = 5 V Symbol Parameter Conditions Min Max Units CIN(2) SDA I/O Pin Capacitance VIN = 0 V 8 pF CIN(2) Input Capacitance (other pins) VIN = 0 V 6 pF ZWPL WP Input Low Impedance VIN < 0.5 V 5 70 k Ω ILWPH WP Input High Leakage VIN > VCC x 0.7 2 µA Note: (1) The DC input voltage on any pin should not be lower than -0.5 V or higher than VCC + 0.5 V. During transitions, the voltage on any pin may undershoot to no less than -1.5 V or overshoot to no more than VCC + 1.5 V, for periods of less than 20 ns. (2) These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC-Q100 and JEDEC test methods. |
Número de pieza similar - CAT25C04 |
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Descripción similar - CAT25C04 |
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