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| NB4N840M_07 |
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ONSEMI |
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NB4N840M http://onsemi.com 4 Table 3. ATTRIBUTES Characteristics Value ESD Protection Human Body Model Machine Model > 2000 V > 110 V Moisture Sensitivity (Note 1) QFN−32 Level 1 Flammability Rating Oxygen Index: 28 to 34 UL 94 V−0 @ 0.125 in Transistor Count 380 Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test 1. For additional information, refer to Application Note AND8003/D. Table 4. MAXIMUM RATINGS Symbol Parameter Condition 1 Condition 2 Rating Unit VCC Positive Power Supply GND = 0 V 3.8 V VI Positive Input GND = 0 V GND = VI = VCC 3.8 V VINPP Differential Input Voltage |D − D| 3.8 V IIN Input Current Through Internal 50 W Resistor Static Surge 45 80 mA mA IOUT Output Current Continuous Surge 25 80 mA mA TA Operating Temperature Range QFN−32 −40 to +85 °C Tstg Storage Temperature Range −65 to +150 °C qJA Thermal Resistance (Junction−to−Ambient) (Note 2) 0 lfpm 500 lfpm QFN−32 QFN−32 31 27 °C/W °C/W qJC Thermal Resistance (Junction−to−Case) 2S2P (Note 3) QFN−32 12 °C/W Tsol Wave Solder Pb−Free <3 sec @ 260 C 260 °C Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. 2. JEDEC standard 51−6, multilayer board − 2S2P (2 signal, 2 power). 3. JEDEC standard multilayer board − 2S2P (2 signal, 2 power) with 8 filled thermal vias under exposed pad. |
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