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SSC-ZCWT824K Datasheet(PDF) 11 Page - Seoul Semiconductor

No. de pieza SSC-ZCWT824K
Descripción Electrónicos  FLASH LED DEVICE
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Fabricante Electrónico  SEOUL [Seoul Semiconductor]
Página de inicio  http://www.seoulsemicon.com
Logo SEOUL - Seoul Semiconductor

SSC-ZCWT824K Datasheet(HTML) 11 Page - Seoul Semiconductor

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12. RELIABILITY
(1) TEST ITEMS AND RESULTS
TEST ITEM
Test conditions
Test Time
Number of
Damaged
Judgment
Resistance to
Soldering Heat*1
Tsld = 260℃,
10 sec.
1 Time
0 /22
OK.
Solderability*1
Tsld = 215±5℃,
5 sec.
1 Time
0 /22
OK.
Thermal Shock*1
-30℃ (30 min) ~ 85℃(30 min)
Transfer 5 min
100 cycles
0 /22
OK.
High Temperature
Storage*1
Ta = 100℃
1000 hrs.
0 /22
OK.
Humidity
Heat Load*1
Ta = 85℃,
RH = 85%
1000 hrs.
0 /22
OK.
Steady State
Life Test
Ta = 25℃,
IF = 20 mA/die
300 hrs
0 /22
OK.
High Humidity
Heat Life Test
Ta = 85℃, RH = 85%,
IF = 10 mA/die
300 hrs
0 /22
OK.
Low Temperature
Life Test
Ta = -30℃, IF = 20 mA/die
300 hrs
0 /22
OK.
Pulse Life Test
Ta = 60℃, RH = 90%
On=2 sec,Off=2sec
IF = 30 mA/die
100,000 cycle
0 /22
OK.
*1 Faulty decision of this test item is made by On / Off after the test.
(2) CRITERIA FOR JUDGING THE DAMAGE
Criteria for Judgement
Item
Symbol
Test Condition
Min.
Max.
Forward Voltage
VF
IF = 20 mA/die
L.S.L×1.2
U.S.L×1.2
Reverse Current
IR
VR = 5 V/die
-
U.S.L×2.0
Luminous Intensity
IV
IF = 20 mA/die
L.S.L×0.5
-
U.S.L. : Upper Standard Level
L.S.L. : Lower Standard Level
(3)ESD guarantee condition
Item
Test Condition
Criteria for Judgement
Test Form
HBM
1000 V
IR =100 ㎂ and below
CONTACT
SEOUL SEMICONDUCTOR CO,. LTD.
148-29 Kasan-Dong, Keumchun-Gu, Seoul, Korea
TEL: 82-2-3281-6269 FAX: 82-2-858-5537
- 11/11
SSC-QP-0401-06(REV0.0)


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