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XXX3491 Datasheet(PDF) 10 Page - Texas Instruments |
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XXX3491 Datasheet(HTML) 10 Page - Texas Instruments |
10 / 28 page www.ti.com PARAMETER MEASUREMENT INFORMATION IY VOD R L 0or3V VY VZ IZ DE VCC II VI Y Z 60 Ω ±1% VOD 0or3V _ + −7V<V(test) <12V DE VCC Y Z D 375 Ω ±1% 375 Ω ±1% VOD(RING) VOD(RING) -VOD(SS) VOD(SS) 0VDifferential VOC 27 Ω ± 1% Input Y Z VY VZ VOC(PP) ∆VOC(SS) VOC 27 Ω ± 1% CL =50pF ±20% D Y Z DE VCC Input:PRR=500kHz,50%DutyCycle,t r<6ns,tf<6ns,ZO =50 Ω CL IncludesFixtureand InstrumentationCapacitance SN65HVD30 – SN65HVD39 SLLS665E – SEPTEMBER 2005 – REVISED MARCH 2008 Figure 1. Driver VOD Test Circuit and Voltage and Current Definitions Figure 2. Driver VOD With Common-Mode Loading Test Circuit Figure 3. VOD(RING) Waveform and Definitions VOD(RING) is measured at four points on the output waveform, corresponding to overshoot and undershoot from the VOD(H) and VOD(L) steady state values. Figure 4. Test Circuit and Definitions for the Driver Common-Mode Output Voltage 10 Submit Documentation Feedback Copyright © 2005–2008, Texas Instruments Incorporated Product Folder Link(s) :SN65HVD30 – SN65HVD39 |
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