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HCF4093 Datasheet(PDF) 7 Page - STMicroelectronics |
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HCF4093 Datasheet(HTML) 7 Page - STMicroelectronics |
7 / 13 page HCF4093 Electrical characteristics 7/13 3.1 Dynamic electrical characteristics ) (*) Typical temperature coefficient for all VDD value is 0.3 %/°C. Figure 3. Test circuit 1. CL = 50 pF or equivalent (includes jig and probe capacitance) 2. RL =200 KΩ 3. RT =ZOUT of pulse generator (typically 50 Ω) Table 7. Dynamic electrical characteristics (Tamb = 25°C, CL =50pF, RL = 200 KΩ, tr =tf =20ns) Symbol Parameter Test Condition Value (*) Unit VDD (V) Min Typ Max tPLH tPHL Propagation delay time 5 190 380 ns 10 90 180 15 65 130 tTLH tTHL Output transition time 5 100 200 ns 10 50 100 15 40 80 |
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