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DAC7718SPAGR Datasheet(PDF) 7 Page - Texas Instruments |
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DAC7718SPAGR Datasheet(HTML) 7 Page - Texas Instruments |
7 / 60 page DAC7718 www.ti.com SBAS467A – MAY 2009 – REVISED DECEMBER 2009 ELECTRICAL CHARACTERISTICS: Single-Supply All specifications at TA = TMIN to TMAX, AVDD = +32V, AVSS = 0V, IOVDD = DVDD = +5V, REF-A and REF-B = +5V, gain = 6, AGND-x = DGND = 0V, data format = straight binary, and OFFSET-A = OFFSET-B = AGND, unless otherwise noted. DAC7718 PARAMETER CONDITIONS MIN TYP MAX UNIT STATIC PERFORMANCE(1) Resolution 12 Bits Linearity error Measured by line passing through codes 010h and FFFh ±1 LSB Differential linearity error Measured by line passing through codes 010h and FFFh ±1 LSB Unipolar zero error TA = +25°C, gain = 4 or 6, code = 010h ±1 LSB Unipolar zero error TC Gain = 4 or 6, code = 010h ±0.5 ±3 ppm FSR/°C TA = +25°C, gain = 6 ±1 LSB Gain error TA = +25°C, gain = 4 ±1 LSB Gain error TC Gain = 4 or 6 ±1 ±3 ppm FSR/°C Full-scale error TA = +25°C, gain = 4 or 6, code = FFFh ±1 LSB Full-scale error TC Gain = 4 or 6, code = FFFh ±0.5 ±3 ppm FSR/°C Measured channel at code = 800h, full-scale change on any DC crosstalk(2) 0.05 LSB other channel ANALOG OUTPUT (VOUT-0 to VOUT-7) (3) VREF = +5V 0 +30 V Voltage output(4) VREF = +1.5V 0 +9 V Output impedance Code = 800h 0.5 Ω Short-circuit current(5) ±8 mA Load current See Figure 84 and Figure 85 ±3 mA TA = +25°C, device operating for 500 hours, full-scale output 3.4 ppm of FSR Output drift vs time TA = +25°C, device operating for 1000 hours, full-scale output 4.3 ppm of FSR Capacitive load stability 500 pF To 0.03% of FSR, CL = 200pF, RL= 10kΩ, code from 010h to 10 μs FFFh and FFFh to 010h To 1 LSB, CL = 200pF, RL = 10kΩ, code from 010h to FFFh Settling time 15 μs and FFFh to 010h To 1 LSB, CL = 200pF, RL = 10kΩ, code from 7F0h to 810h 6 μs and 810h to 7F0h Slew rate(6) 6 V/ μs Power-on delay(7) From IOVDD ≥ +1.8V and DVDD ≥ +2.7V to CS low 200 μs Power-down recovery time 90 μs Digital-to-analog glitch(8) Code from 7FFh to 800h and 800h to 7FFh 4 nV-s Glitch impulse peak amplitude Code from 7FFh to 800h and 800h to 7FFh 5 mV Channel-to-channel isolation(9) VREF = 4VPP, f = 1kHz 88 dB (1) Gain = 4 and TC specified by design and characterization. (2) The DAC outputs are buffered by op amps that share common AVDD and AVSS power supplies. DC crosstalk indicates how much dc change in one or more channel outputs may occur when the dc load current changes in one channel (because of an update). With high-impedance loads, the effect is virtually immeasurable. Multiple AVDD and AVSS terminals are provided to minimize dc crosstalk. (3) Specified by design. (4) The analog output range of VOUT-0 to VOUT-7 is equal to (6 × VREF) for gain = 6. The maximum value of the analog output must not be greater than (AVDD – 0.5V). All specifications are for a +32V power supply and a 0V to +30V output, unless otherwise noted. (5) When the output current is greater than the specification, the current is clamped at the specified maximum value. (6) Slew rate is measured from 10% to 90% of the transition when the output changes from 0 to full-scale. (7) Power-on delay is defined as the time from when the supply voltages reach the specified conditions to when CS goes low, for valid digital communication. (8) Digital-to-analog glitch is defined as the amount of energy injected into the analog output at the major code transition. It is specified as the area of the glitch in nV-s. It is measured by toggling the DAC register data between 7FFh and 800h in straight binary format. (9) Channel-to-channel isolation refers to the ratio of the signal amplitude at the output of one DAC channel to the amplitude of the sinusoidal signal on the reference input of another DAC channel. It is expressed in dB and measured at midscale. Copyright © 2009, Texas Instruments Incorporated Submit Documentation Feedback 7 Product Folder Link(s): DAC7718 |
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