1

FEATURES

YFP PACKAGE

(TOP VIEW)

1

2

3

C

B

A

D

DESCRIPTION/ORDERING INFORMATION

SN74AVC2T872

VOLTAGE-LEVEL SHIFTER FOR IC-USB INTERFACE

• V

• When V

B-Port is Held at GND Through 120-k

Ω

Pulldown

• Crossover Skew of <1 ns

• Meets All Requirements of the IC-USB

Standard

• Small Package: 0.4 mm pitch WCSP

1

2

3

(1.2 mm × 1.6 mm)

A

PD_EN

• Latch-Up Performance Exceeds 100 mA Per

B

D+(A)

D+(B)

JESD 78, Class II ESD Performance

C

D–(A)

GND

D–(B)

–

A-Port (Host Side)

D

DIR

GND

DIR_POL

–

2000-V Human-Body Model

–

1000-V Charged-Device Model

–

B-Port (Peripheral Side)

–

8000-V Contact Discharge

–

15000-V Air-Gap Discharge

The SN74AVC2T872 is a 2-bit voltage level translator optimized for use in interchip USB (IC-USB) applications.

crossover skew to be less than 1 ns. Each B-port has an integrated 120-k

Ω pulldown resistor that can be

B-port I/Os are held to GND through the 120-k

(Hi-Z).

ORDERING INFORMATION

ORDERABLE PART NUMBER

–40°C to 85°C

WCSP – YFP

Reel of 3000

SN74AVC2T872YFPR

_ _ _ TU _

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI

web site at www.ti.com.

(2)

Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.

(3)

YFP: The actual top-side marking has three preceding characters to denote year, month, and sequence code, and one following

character to designate the assembly/test site. Pin 1 identifier indicates solder-bump composition (1 = SnPb, • = Pb-free).

1

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas

Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

PRODUCTION DATA information is current as of publication date.

Copyright © 2008, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.