CAT24M01

http://onsemi.com

2

M0L

ALL

YM

G

M0L = Specific Device Code

A

= Assembly Location Code

LL = Assembly Lot Number

Y

= Year

M

= Month

G

= Pb−Free Package

MARKING DIAGRAMS

24M01A = Specific Device Code

A

= Assembly Location

Y

= Production Year (Last Digit)

M

= Production Month (1−9, O, N, D)

XXX = Last Three Digits of

24M01A

AYMXXX

24M01A = Specific Device Code

A

= Assembly Location

XXX = Last Three Digits of

YY = Production Year (Last Two Digits)

WW = Production Week (Two Digits)

G

= Pb−Free Designator

24M01A

AXXX

YYWWG

(SOIC−8)

(UDFN−8)

(PDIP−8)

Table 1. ABSOLUTE MAXIMUM RATINGS

Parameters

Ratings

Units

Storage Temperature

–65 to +150

°C

Voltage on any Pin with Respect to Ground (Note 1)

–0.5 to +6.5

V

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the

Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect

device reliability.

Symbol

Parameter

Min

Units

Endurance

1,000,000

Program/Erase Cycles

Data Retention

100

Years

2. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC−Q100

and JEDEC test methods.

Table 3. D.C. OPERATING CHARACTERISTICS

Symbol

Parameter

Test Conditions

Min

Max

Units

Read Current

1

mA

Write Current

3

mA

Standby Current

2

mA

5

I/O Pin Leakage

1

mA

2

Input Low Voltage

−0.5

V

Input Low Voltage

−0.5

V

Input High Voltage

V

Input High Voltage

V

Output Low Voltage

0.4

V

Output Low Voltage

0.2

V