Motor de Búsqueda de Datasheet de Componentes Electrónicos |
|
DAC2904IPFB Datasheet(PDF) 2 Page - Texas Instruments |
|
|
DAC2904IPFB Datasheet(HTML) 2 Page - Texas Instruments |
2 / 26 page DAC2904 SBAS198C – AUGUST 2001 – REVISED OCTOBER 2009.............................................................................................................................................. www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. PACKAGE/ORDERING INFORMATION(1) SPECIFIED TRANSPORT PACKAGE- PACKAGE TEMPERATURE PACKAGE ORDERING MEDIA, PRODUCT LEAD DESIGNATOR RANGE MARKING NUMBER (2) QUANTITY DAC2904Y/250 Tape and Reel, 250 DAC2904Y TQFP-48 PFB –40°C to +85°C DAC2904Y DAC2904Y/1K Tape and Reel, 1k DAC2904IPFB Tray, 250 (1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI website at www.ti.com. (2) Models with a slash (/) are available only in tape and reel media in the quantities indicated (for example, /1K indicates 1000 devices per reel). Ordering 1000 pieces of DAC2904Y/1K will get a single 1000-piece tape and reel. ABSOLUTE MAXIMUM RATINGS (1) DAC2904 UNIT +VA to AGND –0.3 to +6 V +VD to DGND –0.3 to +6 V AGND to DGND –0.3 to +0.3 V +VA to +VD –6 to +6 V CLK, PD to DGND –0.3 to VD +0.3 V D0–D9 to DGND –0.3 to VD +0.3 V IOUT, I OUT to AGND –1 to VA + 0.3 V BW, BYP to AGND –0.3 to VA + 0.3 V REFIN, FSA to AGND –0.3 to VA + 0.3 V INT/EXT to AGND –0.3 to VA + 0.3 V Junction Temperature +150 °C Case Temperature +100 °C Storage Temperature +125 °C (1) Stresses above those listed under absolute maximum ratings may cause permanent damage to the device. Exposure to absolute maximum conditions for extended periods may affect device reliability. 2 Submit Documentation Feedback Copyright © 2001–2009, Texas Instruments Incorporated Product Folder Link(s): DAC2904 |
Número de pieza similar - DAC2904IPFB |
|
Descripción similar - DAC2904IPFB |
|
|
Enlace URL |
Política de Privacidad |
ALLDATASHEET.ES |
¿ALLDATASHEET es útil para Ud.? [ DONATE ] |
Todo acerca de Alldatasheet | Publicidad | Contáctenos | Política de Privacidad | Intercambio de Enlaces | Lista de Fabricantes All Rights Reserved©Alldatasheet.com |
Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
Family Site : ic2ic.com |
icmetro.com |