SN74BCT8373

SCAN TEST DEVICE

WITH OCTAL DTYPE LATCHES

SCBS471 − JUNE 1990 − REVISED JUNE 1994

Copyright

2−1

POST OFFICE BOX 655303

POST OFFICE BOX 1443

Family of Testability Products

SN74BCT373 in the Normal-Function Mode

1149.1-1990 (JTAG) Test Access Port and

Boundary-Scan Architecture

Access Port (TAP)

Recognizing a Double-High-Level Voltage

(10 V ) on TMS Pin

− IEEE Standard 1149.1-1990 Required

Instructions, Optional INTEST, CLAMP

and HIGHZ

− Parallel-Signature Analysis at Inputs

− Pseudo-Random Pattern Generation

From Outputs

− Sample Inputs / Toggle Outputs

Small-Outline (DW) Packages and

Standard Plastic 300-mil DIPs (NT)

description

The SN74BCT8373 scan test device with octal D-type latches is a member of the Texas Instruments SCOPE



testability integrated circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan

to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via

the 4-wire test access port (TAP) interface.

In the normal mode, this device is functionally equivalent to the SN74F373 and SN74BCT373 octal D-type

latches. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the

device terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does

not affect the functional operation of the SCOPE

 octal latches.

In the test mode, the normal operation of the SCOPE

 octal latches is inhibited and the test circuitry is enabled

to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform

boundary-scan test operations as described in IEEE Standard 1149.1-1990.

Four dedicated test terminals control the operation of the test circuitry: test data input (TDI), test data output

(TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing

functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation

(PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.

The SN74BCT8373 is characterized for operation from 0

°C to 70°C.

SCOPE is a trademark of Texas Instruments Incorporated.

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LE

1Q

2Q

3Q

4Q

GND

5Q

6Q

7Q

8Q

TDO

TMS

OE

1D

2D

3D

4D

5D

6D

7D

8D

TDI

TCK

DW OR NT PACKAGE

(TOP VIEW)

PRODUCTION DATA information is current as of publication date.

Products conform to specifications per the terms of Texas Instruments

standard warranty. Production processing does not necessarily include

testing of all parameters.