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FMBT3904 Datasheet(PDF) 11 Page - Formosa MS |
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FMBT3904 Datasheet(HTML) 11 Page - Formosa MS |
11 / 11 page High reliability test capabilities 1. 2. 3. 4. 5. 6. 7. 8. Steady State Operating Life High Temperature Reverse Bias Temperature Cycle Autoclave High Temperature Storage Life Solderability High Temperature High Humidity Resistance to Soldering Heat Reverse Bias P =225mW Test Duration:1000hrs Tj 150 V 80 related volage 1000hrs 55 15min to 150 15min Air to Air Transition Time 20sec Test Cycles 1000cycle P 2atm Ta 121 RH 100 Test Duration 96hrs 150 Test Duration 1000hrs 245 5sec Ta 85 85 RH V 80 related volage 1000hrs 260 10sec D CE CE =, = % , -( ) ( ) < : == = % : : =, % , = % , ℃ ℃℃ ℃ ℃ ℃ ℃ ℃ Ta = , , Item Test Conditions NPN Epitaxial Planar Transistor Formosa MS FMBT3904 Page 11 http://www.formosams.com/ TEL:886-2-22696661 FAX:886-2-22696141 Document ID Issued Date Revised Date Revision Page. DS-231106 2008/02/10 2011/07/21 E 11 |
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