– 9 –

CXK582000TM/YM/M

∗

0 to +70°C

0 to +40°C

+25°C

∗

Chip disable to data retention mode

Data retention voltage

Data retention setup time

Recovery time

2.0

—

—

—

—

0

5

—

—

—

0.8

1.4

—

—

5.5

24

4.8

2.4

40

—

—

V

µA

µA

ns

ms

Item

Symbol

Test conditions

Min.

Typ.

Max.

Unit

Data Retention Characteristics

(Ta = 0 to +70°C)

∗ CE1 ≥ Vcc – 0.2V, CE2 ≥ Vcc – 0.2V (CE1 control) or CE2 ≤ 0.2V (CE2 control)

Data retention current

Data retention waveform

• Low supply voltage data retention waveform (1) (CE1 control)

4.5V

2.2V

CE1

GND

Data retention mode

• Low supply voltage data retention waveform (2) (CE2 control)

Data retention mode

CE2 ≤ 0.2V

4.5V

0.4V

CE2

GND