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AD5547-EP Datasheet(PDF) 4 Page - Analog Devices

No. de pieza AD5547-EP
Descripción Electrónicos  Dual-Current Output, Parallel Input
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AD5547-EP Datasheet(HTML) 4 Page - Analog Devices

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AD5547-EP
Data Sheet
Rev. 0 | Page 4 of 12
Parameter
Symbol
Test Conditions/Comments
Min
Typ
Max
Unit
AC CHARACTERISTICS4
Output Voltage Settling Time
tS
To ±0.1% of full scale, data cycles from zero scale
to full scale to zero scale
0.5
μs
Reference Multiplying Bandwidth
BW
VREF = 100 mV rms, data = full scale
6.8
MHz
DAC Glitch Impulse
Q
VREF = 0 V, midscale – 1 to midscale
−3.5
nV-s
Multiplying Feedthrough Error
VOUT/VREF
VREF = 100 mV rms, f = 10 kHz
−78
dB
Digital Feedthrough
QD
WR = 1, LDAC toggles at 1 MHz
7
nV-s
Total Harmonic Distortion
THD
VREF = 5 V p-p, data = full scale, f = 1 kHz
−104
dB
Output Noise Density
eN
f = 1 kHz, BW = 1 Hz
12
nV/√Hz
Analog Crosstalk
CAT
Signal input at Channel A and measures the
output at Channel B, f = 1 kHz
−95
dB
1 All static performance tests (except IOUT) are performed in a closed-loop system using an external precision OP97 I-to-V converter amplifier. The device RFB terminal is
tied to the amplifier output. The +IN pin of the OP97 is grounded, and the IOUT of the DAC is tied to the OP97’s −IN pin. Typical values represent average readings
measured at 25°C.
2 Guaranteed by design; not subject to production testing.
3 All input control signals are specified with tR = tF = 2.5 ns (10% to 90% of 3 V) and are timed from a voltage level of 1.5 V.
4 All ac characteristic tests are performed in a closed-loop system using an AD8038 I-to-V converter amplifier except for THD where the AD8065 was used.
Timing Diagram
tWR
tDS
tDH
tLWD
tLDAC
tRS
WR
DATA
LDAC
RS
Figure 3. AD5547-EP Timing Diagram


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