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74CBTLV3253DS Datasheet(PDF) 6 Page - NXP Semiconductors

No. de pieza 74CBTLV3253DS
Descripción Electrónicos  Dual 1-of-4 multiplexer/demultiplexer
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Fabricante Electrónico  NXP [NXP Semiconductors]
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74CBTLV3253DS Datasheet(HTML) 6 Page - NXP Semiconductors

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74CBTLV3253
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2011. All rights reserved.
Product data sheet
Rev. 4 — 15 December 2011
6 of 19
NXP Semiconductors
74CBTLV3253
Dual 1-of-4 multiplexer/demultiplexer
9.2 ON resistance
[1]
Typical values are measured at Tamb =25 C and nominal VCC.
[2]
Measured by the voltage drop between the A and B terminals at the indicated current through the switch. ON-state resistance is
determined by the lower of the voltages of the two (A or B) terminals.
9.3 ON resistance test circuit and graphs
Table 7.
Resistance RON
At recommended operating conditions; voltages are referenced to GND (ground = 0 V); for test circuit see Figure 7.
Symbol Parameter
Conditions
Tamb = 40 C to +85 C
Tamb = 40 C to +125 C
Unit
Min
Typ[1]
Max
Min
Max
RON
ON resistance VCC = 2.3 V to 2.7 V;
see Figure 8 to Figure 10
[2]
ISW =64mA; VI = 0 V
-
4.2
8.0
-
15.0
ISW =24 mA; VI = 0 V
-
4.2
8.0
-
15.0
ISW = 15 mA; VI = 1.7 V
-
8.4
40.0
-
60.0
VCC = 3.0 V to 3.6 V;
see Figure 11 to Figure 13
ISW =64mA; VI =0V
-
4.0
7.0
-
11.0
ISW =24 mA; VI =0V
-
4.0
7.0
-
11.0
ISW = 15 mA; VI = 2.4 V
-
6.2
15.0
-
25.5
RON =VSW / ISW.(1) Tamb = 125 C.
(2) Tamb = 85 C.
(3) Tamb = 25 C.
(4) Tamb = 40 C.
Fig 7.
Test circuit for measuring ON resistance
(one switch)
Fig 8.
ON resistance as a function of input voltage;
VCC = 2.5 V; ISW = 15 mA
001aai104
nA
nOE
VIL
nBn
GND
VCC
Vl
VSW
ISW
V
VI (V)
0
2.5
2.0
1.0
1.5
0.5
001aai109
7
5
9
11
RON
(
Ω)
3
(1)
(3)
(4)
(2)


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