2SJ411

5

REFERENCE

Document Name

Document No.

NEC semiconductor device reliability/quality control system

TEI-1202

Quality grade on NEC semiconductor devices

IEI-1209

Semiconductor device mounting technology manual

C10535E

Guide to quality assurance for semiconductor devices

MEI-1202

Semiconductor selection guide

X10679E

TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH

1 m

PW - Pulse Width - S

1

100

0.1

Single pulse

10

1000

10 m

100 m

1

10

100

1000