ADC12030CIWMX datasheet(7/53 Pages) TI1

No. de pieza	ADC12030CIWMX

Descripción Electrónicos	Self-Calibrating 12-Bit Plus Sign Serial I/O A/D Converters with MUX and Sample/Hold

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Fabricante Electrónico	TI1 [Texas Instruments]

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ADC12030, ADC12032, ADC12034

ADC12038, ADC12H030, ADC12H032

ADC12H034, ADC12H038

www.ti.com

SNAS080K – JULY 1999 – REVISED MARCH 2013

Converter Electrical Characteristics (continued)

The following specifications apply for V

+ = V

A+ = VD+ = +5.0 VDC, VREF+ = +4.096 VDC, VREF− = 0 VDC, 12-bit + sign

conversion mode, fCK = fSK = 8 MHz for the ADC12H030, ADC12H032, ADC12H034 and ADC12H038, fCK = fSK = 5 MHz for

the ADC12030, ADC12032, ADC12034 and ADC12038, RS = 25Ω, source impedance for VREF+ and VREF− ≤ 25Ω, fully-

differential input with fixed 2.048V common-mode voltage, and 10(tCK) acquisition time unless otherwise specified. Boldface

limits apply for TA = TJ = TMIN to TMAX; all other limits TA = TJ = 25°C.

(1)(2)(3)

Units

Parameter

Test Conditions

Typical (4)

Limits (5)

(Limits)

TUE

Total Unadjusted Error

After Auto Cal (6)(10)(11)

±1

LSB

Resolution with No Missing Codes

8-bit + sign mode

8 + sign

Bits (min)

INL

Integral Linearity Error

8-bit + sign mode (6)

±1/2

LSB (max)

DNL

Differential Non-Linearity

8-bit + sign mode

±3/4

LSB (max)

Positive Full-Scale Error

8-bit + sign mode (6)

±1/2

LSB (max)

Negative Full-Scale Error

8-bit + sign mode (6)

±1/2

LSB (max)

8-bit + sign mode, after Auto Zero

Offset Error

±1/2

LSB (max)

VIN(+) = VIN(−) = + 2.048V

(10)

8-bit + sign mode after Auto Zero

TUE

Total Unadjusted Error

±3/4

LSB (max)

(6) (10) (11)

Multiplexer Chan-to-Chan Matching

±0.05

LSB

Power Supply Sensitivity

V+ = +5V ±10%, VREF = +4.096V

Offset Error

±0.5

±1

LSB (max)

+ Full-Scale Error

±0.5

±1.5

LSB (max)

− Full-Scale Error

±0.5

±1.5

LSB (max)

Integral Linearity Error

±0.5

LSB

Output Data from “12-Bit

+10

LSB (max)

(see Table 5) (12)

Conversion of Offset”

−10

LSB (min)

Output Data from “12-Bit

4095

LSB (max)

(see Table 5) (12)

Conversion of Full-Scale”

4093

LSB (min)

UNIPOLAR DYNAMIC CONVERTER CHARACTERISTICS

fIN = 1 kHz, VIN = 5 VP-P, VREF

+ = 5.0V

69.4

dB

S/(N+D)

Signal-to-Noise Plus Distortion Ratio fIN = 20 kHz, VIN = 5 VP-P, VREF

+ = 5.0V

68.3

dB

fIN = 40 kHz, VIN = 5 VP-P, VREF+ = 5.0V

65.7

dB

−3 dB Full Power Bandwidth

VIN = 5 VP-P, where S/(N+D) drops 3 dB

31

kHz

DIFFERENTIAL DYNAMIC CONVERTER CHARACTERISTICS

fIN = 1 kHz, VIN = ±5V, VREF

+ = 5.0V

77.0

dB

S/(N+D)

Signal-to-Noise Plus Distortion Ratio fIN = 20 kHz, VIN = ±5V, VREF

+ = 5.0V

73.9

dB

fIN = 40 kHz, VIN = ±5V, VREF

+ = 5.0V

67.0

dB

−3 dB Full Power Bandwidth

VIN = ±5V, where S/(N+D) drops 3 dB

40

kHz

REFERENCE INPUT, ANALOG INPUTS AND MULTIPLEXER CHARACTERISTICS

CREF

Reference Input Capacitance

85

pF

A/DIN1, A/DIN2 Analog Input

CA/D

75

pF

Capacitance

A/DIN1, A/DIN2 Analog Input

VIN = +5.0V or VIN = 0V

±0.1

±1.0

µA (max)

Leakage Current

GND

− 0.05

V (min)

CH0–CH7 and COM Input Voltage

(VA+) + 0.05

V (max)

CH0–CH7 and COM Input

CCH

10

pF

Capacitance

CMUXOUT

MUX Output Capacitance

20

pF

(10) Offset error is a measure of the deviation from the mid-scale voltage (a code of zero), expressed in LSB. It is the worst-case value of the

code transitions between 1 to 0 and 0 to +1 (see Figure 8).

(11) Total unadjusted error includes offset, full-scale, linearity and multiplexer errors.

(12) The “12-Bit Conversion of Offset” and “12-Bit Conversion of Full-Scale” modes are intended to test the functionality of the device.

Therefore, the output data from these modes are not an indication of the accuracy of a conversion result.

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Product Folder Links: ADC12030 ADC12032 ADC12034 ADC12038 ADC12H030 ADC12H032 ADC12H034

ADC12H038

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ADC12030CIWMX Datasheet(PDF) 7 Page - Texas Instruments

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