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LC79401KNE-E Datasheet(PDF) 2 Page - ON Semiconductor |
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LC79401KNE-E Datasheet(HTML) 2 Page - ON Semiconductor |
2 / 8 page LC79401KNE No. A1419-2/8 Specifications Absolute Maximum Ratings at Ta = 25 ±2°C, VSS = 0V Parameter Symbol Conditions Ratings unit Maximum supply voltage (Logic) VDD max -0.3 to +7.0 V Maximum supply voltage (LCD) VDD-VEE max *1 0 to 35 V Maximum input voltage VI max -0.3 to VDD+0.3 V Storage temperature Tstg -40 to +125 °C Note *1 VDD≥V1>V3>V4>VEE, VDD-V3≤7V, V4-VEE≤7V Allowable Operating Ranges at Ta = -20 to +85 °C, VSS = 0V Parameter Symbol Conditions min typ max unit Supply voltage (Logic) VDD 2.7 5.5 V Supply voltage (LCD) VDD-VEE *2, 3 12 32 V Input high level voltage VIH DI1 to DI4, CP, LOAD, CDI, R/L, M, DISPOFF 0.8VDD V Input low level voltage VIL DI1 to DI4, CP, LOAD, CDI, R/L, M, DISPOFF 0.2VDD V CP Shift clock fCP CP 6.0 MHz CP pulse width tWC CP 50 ns LOAD pulse width tWL LOAD 50 ns Setup time tSETUP DI1 to DI4 → CP 30 ns VDD=2.7 to 4.5V 40 ns Hold time tHOLD DI1 to DI4 → CP VDD=4.5 to 5.5V 30 ns CP → LOAD tCL CP → LOAD 80 ns tLC1 LOAD → CP 110 ns VDD=2.7 to 4.5V 30 ns LOAD → CP tLC2 LOAD → CP VDD=4.5 to 5.5V 15 ns CP and LOAD rise time tR CP, LOAD *4 ns CP and LOAD fall time tF CP, LOAD *4 ns Note *2 VDD≥V1>V3>V4>VEE, VDD-V3≤7V, V4-VEE≤7V *3 When the power is turned on, either the logic system power must be turned on before the LCD drive system power or else they must both be turned on at the same time. When the power is turned off, either the LCD drive system power must be turned off before the logic system power, or else both must be turned off at the same time. *4 The CP and LOAD rise time (tR) and the CP and LOAD fall time (tF) must satisfy equations (1) and (2) below at the same time. (1) tR, tF < 1 2fCP - tWC (2) tR, tF < 50ns Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. |
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