HIP0060 datasheet(3/7 Pages) INTERSIL | 1.5A, 50V Quad Low Side Power Driver with Serial Bus Control and Fault Protection

3 page

Description of Diagnostics

OC (Over-Current) Fault Mode

In a short circuit or over-current fault condition when an out-

put is switched on, the output current is limited to the ICL

maximum as deﬁned in the Electrical Speciﬁcations. An OC

fault condition does not shutdown the output. The current is

sensed and feedback is directed to the gate of the MOS Out-

put Driver. The gate voltage is reduced to maintained the

speciﬁed level of current limiting. In this mode, the drain volt-

age will increase and cause increased dissipation.

OT (Over-Temperature) Fault Mode

Under a high dissipation over-temperature fault condition,

the output temperature is detected and compared to a preset

threshold level. When the OT threshold is exceeded, thermal

shutdown for that output occurs. The Gate Control Latch

drive to the output is switched off and a status ﬂag (the OT

Bit) for the fault is set. The output shutdown action is inde-

pendent of the IN input state. However, the Gate Control

Latch and OL Bit will be reset on the next rising edge of the IN

input and, if the fault still exists, the shutdown action will repeat.

Diagnostic action for an OT fault includes feedback of the

fault status to the Serial Diagnostic Register for a SPI bus

data output. Also, as shown in the Block Diagram, the OT

fault status bit information is ORed into a one-shot that

drives an open drain to provide an INT interrupt signal out-

put. The INT output has a speciﬁed timing from the one-shot

multi and is deﬁned in the Electrical Speciﬁcations as tINT.

OL (Open-Load) Fault Mode

An open-load fault mode sequence consists of setting a sta-

tus ﬂag (the OL Bit) when an output open load condition is

detected. If the output impedance is greater than a preset

threshold, as detected when the input is off; the status bit is

set. The OL Bit is reset on the next falling edge of the IN

input signal. The off-on detection sequence will repeat as

long as the output impedance is higher than the detection

threshold, as detected in the off state.

Diagnostic action for an OL fault mode differs from the OT

fault mode by not forcing an output shutdown through the

Gate Controlled Latch. Also, because the OL fault is

detected in the off state, the status ﬂag is reset on the falling

edge of the input instead of the rising edge. The OL output

information to the Serial Diagnostic Register and the INT pin

is the same as the OT fault mode action.

ORed Fault Bits

It is important to note that the trigger input to the one-shot is

locked-out for the tINT duration and any fault that may have

occurred in the tINT window will not be displayed at the INT

output. However, all 8 fault bits may still be read as data from

the SO output when clock by the SCK input. The INT fault

output is provided as an interrupt signal to ﬂag the immedi-

ate occurrence of a fault and take appropriate action as

deﬁned by the microcontroller to the SPI bus and the users

programming. The INT fault output may be ORed with other

ICs to provide a system microcontroller interrupt to indicate

the presence of a fault.

DIAGNOSTIC

Pulse Width, INT

tINT

µs

Fault Response Time

tFAULT

µs

OVER-TEMPERATURE PROTECTION

Over-Temperature Shutdown

TSD

160

SERIAL PERIPHERAL INTERFACE TIMING

(Capacitance Each Pin, CL = 200pF)

SCK Period

tCYC

500

SCK Clock High/Low Time

tWSCKH,

tWSCKL

200

SCK Rise/Fall Time

trSCK,

tfSCK

Enable Lead/Lag Time

tLEAD,

tLAG

250

Output Data Valid Time

170

Data Setup Time

tSU

Disable Time

tDIS

250

Electrical Speciﬁcations

VDD = 4.5V to 5.5V, VSS = 0V, TA = -40

oC to 125oC; Unless Otherwise Speciﬁed (Continued)

PARAMETER

SYMBOL

CONDITIONS

MIN

TYP

MAX

UNITS

HIP0060

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