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74CBTLV1G125 Datasheet(PDF) 11 Page - NXP Semiconductors |
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74CBTLV1G125 Datasheet(HTML) 11 Page - NXP Semiconductors |
11 / 21 page 74CBTLV1G125 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved. Product data sheet Rev. 4 — 5 September 2012 11 of 21 NXP Semiconductors 74CBTLV1G125 Single bus switch Test data is given in Table 12. Definitions for test circuit: RL = Load resistance. CL = Load capacitance including jig and probe capacitance. RT = Termination resistance should be equal to the output impedance Zo of the pulse generator. VEXT = Test voltage for switching times. Fig 13. Test circuit for measuring switching times VEXT VCC VI VO mna616 DUT CL RT RL RL G Table 12. Test data Supply voltage Load VEXT VCC CL tPLH, tPHL tPZH, tPHZ tPZL, tPLZ 2.3 V to 2.7 V 30 pF open GND 2 V CC 3.0 V to 3.6 V 50 pF open GND 2 V CC |
Número de pieza similar - 74CBTLV1G125_15 |
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Descripción similar - 74CBTLV1G125_15 |
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