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AMC7823 Datasheet(PDF) 6 Page - Texas Instruments |
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AMC7823 Datasheet(HTML) 6 Page - Texas Instruments |
6 / 55 page AMC7823 SLAS453F – APRIL 2005 – REVISED MARCH 2012 www.ti.com ELECTRICAL CHARACTERISTICS: +3V At –40°C to +85°C, AVDD, DVDD, BVDD = 3V, using external 1.25V reference, unless otherwise noted. AMC7823 PARAMETER TEST CONDITIONS MIN TYP MAX UNIT ADC ANALOG INPUTS Input voltage range 0 2 × VREF V Input impedance 5 M Ω Input capacitance 15 pF Input leakage current ±1 μA ANALOG-TO-DIGITAL CONVERTER Resolution 12 Bits No missing codes 12 Bits Integral linearity –1.25 +1.25 LSB(1) Differential linearity –1 +1.25 LSB Offset error ±3 LSB Offset error drift ±4 ppmFS/°C Offset error match 0.5 1 LSB Gain error ±12 LSB Gain error match 0.3 1.5 LSB Noise 70 μVRMS Power-supply rejection AVDD = 3V ±5% 70 dB Sample rate(2) 200 kHz Total conversion time Scan Channels 0 through 7 47 μs Total conversion time including temperature Scan Channels 0 through 8 58 μs Channel-to-channel isolation VIN = 2.5VPP at 10kHz 0.5 LSB DIGITAL-TO-ANALOG CONVERTER(3) Output voltage range Programmable 0 2 × VREF V Output current Refer to Typical Characteristics ±1 mA Resolution 12 Bits Integral linearity(4) ±2 ±8 LSB Monotonicity 12 Bits Differential linearity ±0.2 ±1 LSB Output range = 0 to VREF ±0.5 ±5 mV Offset error Output range = 0 to 2 x VREF ±1 ±10 mV Offset error drift ±4 ppmFS/°C Gain error Output range = 0 to 2 x VREF ±0.2 ±1.0 %FS Step between code 0x400 to 0xC00, Settling time 2 μs to ±1LSB Code change glitch 1LSB change, in worst case 20 nV-s Overshoot Step between code 0x400 to 0xC00 200 mV Crosstalk Step between code 0x400 to 0xC00 <0.5 LSB Sine wave (1kHz, 5VPP) generated by DAC, Signal-to-noise ratio sampling at 400kSPS, RL = 10kΩ, 74 dB CL = 100pF Output buffer gain = 2 60 nV/ √Hz Output noise voltage density Output buffer gain = 1 30 nV/ √Hz (1) LSB means least significant bit. (2) Single-channel conversion only. Does not include control logic delay associated with ADC operation, such as from the trigger signal to the start of conversion. (3) DAC is tested with load of 25k Ω in parallel with 100pF to ground. (4) Measured from code 0x008 to 0xFFF. 6 Submit Documentation Feedback Copyright © 2005–2012, Texas Instruments Incorporated Product Folder Link(s): AMC7823 |
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