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AMC7823 Datasheet(PDF) 6 Page - Texas Instruments

No. de pieza AMC7823
Descripción Electrónicos  ANALOG MONITORING AND CONTROL CIRCUIT
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AMC7823 Datasheet(HTML) 6 Page - Texas Instruments

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AMC7823
SLAS453F – APRIL 2005 – REVISED MARCH 2012
www.ti.com
ELECTRICAL CHARACTERISTICS: +3V
At –40°C to +85°C, AVDD, DVDD, BVDD = 3V, using external 1.25V reference, unless otherwise noted.
AMC7823
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
ADC ANALOG INPUTS
Input voltage range
0
2 × VREF
V
Input impedance
5
M
Input capacitance
15
pF
Input leakage current
±1
μA
ANALOG-TO-DIGITAL CONVERTER
Resolution
12
Bits
No missing codes
12
Bits
Integral linearity
–1.25
+1.25
LSB(1)
Differential linearity
–1
+1.25
LSB
Offset error
±3
LSB
Offset error drift
±4
ppmFS/°C
Offset error match
0.5
1
LSB
Gain error
±12
LSB
Gain error match
0.3
1.5
LSB
Noise
70
μVRMS
Power-supply rejection
AVDD = 3V ±5%
70
dB
Sample rate(2)
200
kHz
Total conversion time
Scan Channels 0 through 7
47
μs
Total conversion time including temperature Scan Channels 0 through 8
58
μs
Channel-to-channel isolation
VIN = 2.5VPP at 10kHz
0.5
LSB
DIGITAL-TO-ANALOG CONVERTER(3)
Output voltage range
Programmable
0
2 × VREF
V
Output current
Refer to Typical Characteristics
±1
mA
Resolution
12
Bits
Integral linearity(4)
±2
±8
LSB
Monotonicity
12
Bits
Differential linearity
±0.2
±1
LSB
Output range = 0 to VREF
±0.5
±5
mV
Offset error
Output range = 0 to 2 x VREF
±1
±10
mV
Offset error drift
±4
ppmFS/°C
Gain error
Output range = 0 to 2 x VREF
±0.2
±1.0
%FS
Step between code 0x400 to 0xC00,
Settling time
2
μs
to ±1LSB
Code change glitch
1LSB change, in worst case
20
nV-s
Overshoot
Step between code 0x400 to 0xC00
200
mV
Crosstalk
Step between code 0x400 to 0xC00
<0.5
LSB
Sine wave (1kHz, 5VPP) generated by DAC,
Signal-to-noise ratio
sampling at 400kSPS, RL = 10kΩ,
74
dB
CL = 100pF
Output buffer gain = 2
60
nV/
√Hz
Output noise voltage density
Output buffer gain = 1
30
nV/
√Hz
(1)
LSB means least significant bit.
(2)
Single-channel conversion only. Does not include control logic delay associated with ADC operation, such as from the trigger signal to
the start of conversion.
(3)
DAC is tested with load of 25k
Ω in parallel with 100pF to ground.
(4)
Measured from code 0x008 to 0xFFF.
6
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Copyright © 2005–2012, Texas Instruments Incorporated
Product Folder Link(s): AMC7823


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