SN54HC245, SN74HC245

SCLS131E – DECEMBER 1982 – REVISED SEPTEMBER 2015

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6 Specifications

6.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)

(1)

MIN

MAX

UNIT

Supply voltage

−0.5

7

V

±20

mA

±20

mA

Continuous output current

±35

mA

±70

mA

Storage temperature

–65

150

°C

(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating

Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

The input and output voltage ratings may be exceeded if the input and output current ratings are observed.

6.2 ESD Ratings

VALUE

UNIT

±3000

Electrostatic discharge

V

Charged-device model (CDM), per JEDEC specification JESD22-

±1000

(1)

JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.

(2)

JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.

6.3 Recommended Operating Conditions

over operating free-air temperature range (unless otherwise noted)

(1)

SN54HC245

SN74HC245

UNIT

MIN

NOM

MAX

MIN

NOM

MAX

Supply voltage

2

5

6

2

5

6

V

1.5

1.5

High-level input voltage

3.15

3.15

V

4.2

4.2

0.5

0.5

Low-level input voltage

1.35

1.35

V

1.8

1.8

Input voltage

0

0

V

Output voltage

0

0

V

1000

1000

∆t/∆v

Input transition rise and fall time

500

500

ns

400

400

Operating free-air temperature

–55

125

–40

85

°C

(1)

Implications of Slow or Floating CMOS Inputs, literature number SCBA004.

4

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