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ADC0811CCN Datasheet(PDF) 4 Page - National Semiconductor (TI) |
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ADC0811CCN Datasheet(HTML) 4 Page - National Semiconductor (TI) |
4 / 14 page Electrical Characteristics The following specifications apply for VCC e 475V to 525V VREF ea46V to (VCC a 01V) w2 CLK e 2097 MHz unless otherwise specified Boldface limits apply from TMIN to TMAX all other limits TA e TJ e 25 C (Continued) Typical Tested Design Parameter Conditions (Note 6) Limit Limit Units (Note 7) (Note 8) AC CHARACTERISTICS (Continued) tSDI Minimum DI Set-up Time to SCLK 200 400 ns Rising Edge tDDO Maximum Delay From SCLK RLe30k 180 400 400 ns Falling Edge to DO Data Valid CLe100 pF tTRI Maximum DO Hold Time RLe3k (CS Rising edge to DO CLe100 pF 90 150 150 ns TRI-STATE) tCA Analog After Address Is Latched 4SCLKa1 ms sec Sampling Time CSeLow tRDO Maximum DO RLe30 kX ‘‘TRI-STATE’’ to ‘‘HIGH’’ State 75 150 150 ns Rise Time CLe100 pf ‘‘LOW’’ to ‘‘HIGH’’ State 150 300 300 tFDO Maximum DO RLe30 kX ‘‘TRI-STATE’’ to ‘‘LOW’’ State 75 150 150 ns Fall Time CLe100 pf ‘‘HIGH’’ to ‘‘LOW’’ State 150 300 300 CIN Maximum Input Analog Inputs ANO – AN10 and VREF 11 55 pF Capacitance All Others 5 15 Note 1 Absolute Maximum Ratings indicate limits beyond which damage to the device may occur DC and AC electrical specifications do not apply when operating the device beyond its specified operating conditions Note 2 All voltages are measured with respect to ground Note 3 Under over voltage conditions (VINk0V and VINlVCC) the maximum input current at any one pin is g5 mA If the voltage at more than one pin exceeds VCC a 3V the total package current must be limited to 20 mA For example the maximum number of pins that can be over driven at the maximum current level of g 5 mA is four Note 4 Total unadjusted error includes offset full-scale linearity multiplexer and hold step errors Note 5 Two on-chip diodes are tied to each analog input which will forward-conduct for analog input voltages one diode drop below ground or one diode drop greater than VCC supply Be careful during testing at low VCC levels (45V) as high level analog inputs (5V) can cause this input diode to conduct especially at elevated temperatures and cause errors for analog inputs near full-scale The spec allows 50 mV forward bias of either diode This means that as long as the analog VIN does not exceed the supply voltage by more than 50 mV the output code will be correct To achieve an absolute 0 VDC to5VDC input voltage range will therefore require a minimum supply voltage of 4950 VDC over temperature variations initial tolerance and loading Note 6 Typicals are at 25 C and represent most likely parametric norm Note 7 Guaranteed and 100% production tested under worst case condition Note 8 Guaranteed but not 100% production tested These limits are not used to calculate outgoing quality levels Note 9 Channel leakage current is measured after the channel selection Note 10 1 count e VREF 256 Note 11 Human body model 100 pF discharged through a 15 kX resistor Test Circuits Leakage Current TLH5587 – 17 D0 Except ‘‘TRI-STATE’’ TLH5587 – 6 4 |
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