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8V182512IDGGREP Datasheet(PDF) 1 Page - Texas Instruments |
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8V182512IDGGREP Datasheet(HTML) 1 Page - Texas Instruments |
1 / 38 page SN74LVTH18512EP, SN74LVTH182512EP 3.3V ABT SCAN TEST DEVICES WITH 18BIT UNIVERSAL BUS TRANSCEIVERS SCBS790 − NOVEMBER 2003 1 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 D Controlled Baseline − One Assembly/Test Site, One Fabrication Site D Enhanced Diminishing Manufacturing Sources (DMS) Support D Enhanced Product-Change Notification D Qualification Pedigree† D Members of the Texas Instruments SCOPE Family of Testability Products D Members of the Texas Instruments Widebus Family D State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) D Support Unregulated Battery Operation Down to 2.7 V D UBT (Universal Bus Transceiver) Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode D Bus Hold on Data Inputs Eliminates the Need for External Pullup/Pulldown Resistors D B-Port Outputs of SN74LVTH182512 Device Has Equivalent 25- Ω Series Resistors, So No External Resistors Are Required D SCOPE Instruction Set − IEEE Std 1149.1-1990 Required Instructions and Optional CLAMP and HIGHZ − Parallel-Signature Analysis at Inputs − Pseudo-Random Pattern Generation From Outputs − Sample Inputs/Toggle Outputs − Binary Count From Outputs − Device Identification − Even-Parity Opcodes † Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits. D Compatible With the IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Copyright 2003, Texas Instruments Incorporated UNLESS OTHERWISE NOTED this document contains PRODUCTION DATA information current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SCOPE, Widebus, and UBT are trademarks of Texas Instruments. 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 64 63 62 61 60 59 58 57 56 55 54 53 52 51 50 49 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 1CLKAB 1LEAB 1OEAB 1A1 1A2 GND 1A3 1A4 1A5 VCC 1A6 1A7 1A8 GND 1A9 2A1 2A2 2A3 GND 2A4 2A5 2A6 VCC 2A7 2A8 2A9 GND 2OEAB 2LEAB 2CLKAB TDO TMS 1CLKBA 1LEBA 1OEBA 1B1 1B2 GND 1B3 1B4 1B5 VCC 1B6 1B7 1B8 GND 1B9 2B1 2B2 2B3 GND 2B4 2B5 2B6 VCC 2B7 2B8 2B9 GND 2OEBA 2LEBA 2CLKBA TDI TCK DGG PACKAGE (TOP VIEW) |
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