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SN74HC132N Datasheet(PDF) 4 Page - Texas Instruments |
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SN74HC132N Datasheet(HTML) 4 Page - Texas Instruments |
4 / 28 page 4 SN54HC132 SN74HC132 SCLS034G – DECEMBER 1982 – REVISED JUNE 2016 www.ti.com Product Folder Links: SN54HC132 SN74HC132 Submit Documentation Feedback Copyright © 1982–2016, Texas Instruments Incorporated (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) The input and output voltage ratings may be exceeded if the input and output current ratings are observed. 6 Specifications 6.1 Absolute Maximum Ratings over operating free-air temperature range (unless otherwise noted) (1) MIN MAX UNIT VCC Supply voltage –0.5 7 V IIK Input clamp current(2) VI < 0 or VI > VCC ±20 mA IOK Output clamp current(2) VO < 0 or VO > VCC ±20 mA IO Continuous output current VO = 0 to VCC ±25 mA Continuous current through VCC or GND ±50 mA TJ Junction temperature 150 °C Tstg Storage temperature –65 150 °C (1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. (2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. 6.2 ESD Ratings VALUE UNIT V(ESD) Electrostatic discharge Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) ±2000 V Charged-device model (CDM), per JEDEC specification JESD22-C101(2) ±1000 (1) All unused inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report, Implications of Slow or Floating CMOS Inputs. 6.3 Recommended Operating Conditions See (1) MIN NOM MAX UNIT VCC Supply voltage 2 5 6 V VI Input voltage 0 VCC V VO Output voltage 0 VCC V TA Operating free-air temperature SN54HC132 –55 125 °C SN74HC132 –40 85 (1) For more information about traditional and new thermal metrics, see the application report, Semiconductor and IC Package Thermal Metrics. (2) The package thermal impedance is calculated in accordance with JESD 51-7. 6.4 Thermal Information THERMAL METRIC(1) SN74HC132 UNIT D (SOIC) DB (SSOP) N (PDIP) NS (SO) PW (TSSOP) 14 PINS 14 PINS 14 PINS 14 PINS 14 PINS RθJA Junction-to-ambient thermal resistance(2) 84.3 99.1 50.9 84.3 113.3 °C/W RθJC(top) Junction-to-case (top) thermal resistance 44.8 51.3 38.2 42.2 42.8 °C/W RθJB Junction-to-board thermal resistance 38.5 46.3 30.8 43.0 54.8 °C/W ψJT Junction-to-top characterization parameter 13.9 17.7 23.1 13.5 4.0 °C/W ψJB Junction-to-board characterization parameter 38.2 45.8 30.7 42.7 54.3 °C/W |
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