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LC78616PE-6D02-H Datasheet(PDF) 3 Page - ON Semiconductor

No. de pieza LC78616PE-6D02-H
Descripción Electrónicos  Digital Servo Processor LSI
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Fabricante Electrónico  ONSEMI [ON Semiconductor]
Página de inicio  http://www.onsemi.com
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LC78616PE-6D02-H Datasheet(HTML) 3 Page - ON Semiconductor

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LC78616PE
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3
Specifications
Absolute Maximum Ratings at Ta = 25°C, DVSS = AVSS = XVSS = VVSS1 = 0 V
Parameter
Symbol
Conditions
Ratings
Unit
Maximum supply voltage
VDD max
DVDD, AVDD, XVDD, VVDD1
0.3 to +3.95
V
Input voltage 1
VIN1
0.3 to DVDD+0.3
Output voltage
VOUT
0.3 to DVDD +0.3
Allowable power dissipation
Pd max
Ta ≤ 85°C
Mounted reference PCB(*)
300
mW
Operating temperature
Topr
40 to +85
°C
Storage temperature
Tstg
40 to +125
(*) Reference PCB : 114.3 mm × 76.1 mm × 1.6 mm, glass epoxy resin
<Notes>
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation
above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended
Operating Conditions may affect device reliability.
Allowable Operating Ranges at Ta = 40 to 85°C, DVSS = AVSS = XVSS = VVSS1 = 0 V
Parameter
Symbol
Pin Names
Type
Conditions
MIN
TYP
MAX
Unit
Supply voltage
VDD
DVDD, AVDD,
XVDD, VVDD1
3.00
3.60
V
High-level input
voltage
VIH
XIN,RESB, MODE, MODE3,
CE, CL, DI,
CONT00, CONT01, CONT02,
CONT03, CONT04, CONT05,
CONT08, CONT09, CONT10,
DO,
SDDAT00 to 15,
SDADRS11, SDADRS12
Schmitt
2.00
VDD
Low-level input
voltage
VIL
XIN, RESB, TEST, MODE3,
CE, CL, DI,
CONT00, CONT01, CONT02,
CONT03, CONT04, CONT05,
CONT08, CONT09, CONT10,
DO,
SDDAT00 to 15,
SDADRS11, SDADRS12
Schmitt
0.00
0.80
Crystal Oscillator
Frequency
FX
XIN
Oscillator
circuit
16.9344
MHz
XOUT
External
clock Input
EXCK
XIN
Schmitt
16.9344
18.0
MHz
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed,
damage may occur and reliability may be affected.
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond the Recommended
Operating Ranges limits may affect device reliability.


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