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LC78616PE-6D02-H Datasheet(PDF) 3 Page - ON Semiconductor |
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LC78616PE-6D02-H Datasheet(HTML) 3 Page - ON Semiconductor |
3 / 27 page LC78616PE www.onsemi.com 3 Specifications Absolute Maximum Ratings at Ta = 25°C, DVSS = AVSS = XVSS = VVSS1 = 0 V Parameter Symbol Conditions Ratings Unit Maximum supply voltage VDD max DVDD, AVDD, XVDD, VVDD1 0.3 to +3.95 V Input voltage 1 VIN1 0.3 to DVDD+0.3 Output voltage VOUT 0.3 to DVDD +0.3 Allowable power dissipation Pd max Ta ≤ 85°C Mounted reference PCB(*) 300 mW Operating temperature Topr 40 to +85 °C Storage temperature Tstg 40 to +125 (*) Reference PCB : 114.3 mm × 76.1 mm × 1.6 mm, glass epoxy resin <Notes> Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. Allowable Operating Ranges at Ta = 40 to 85°C, DVSS = AVSS = XVSS = VVSS1 = 0 V Parameter Symbol Pin Names Type Conditions MIN TYP MAX Unit Supply voltage VDD DVDD, AVDD, XVDD, VVDD1 3.00 3.60 V High-level input voltage VIH XIN,RESB, MODE, MODE3, CE, CL, DI, CONT00, CONT01, CONT02, CONT03, CONT04, CONT05, CONT08, CONT09, CONT10, DO, SDDAT00 to 15, SDADRS11, SDADRS12 Schmitt 2.00 VDD Low-level input voltage VIL XIN, RESB, TEST, MODE3, CE, CL, DI, CONT00, CONT01, CONT02, CONT03, CONT04, CONT05, CONT08, CONT09, CONT10, DO, SDDAT00 to 15, SDADRS11, SDADRS12 Schmitt 0.00 0.80 Crystal Oscillator Frequency FX XIN Oscillator circuit 16.9344 MHz XOUT External clock Input EXCK XIN Schmitt 16.9344 18.0 MHz Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond the Recommended Operating Ranges limits may affect device reliability. |
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