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MC100E158FNG Datasheet(PDF) 5 Page - ON Semiconductor |
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MC100E158FNG Datasheet(HTML) 5 Page - ON Semiconductor |
5 / 8 page MC10E158, MC100E158 www.onsemi.com 5 Table 7. 100E SERIES NECL DC CHARACTERISTICS (VCCx = 0 V; VEE = −5.0 V (Note 1)) Symbol Characteristic 0°C 25°C 85°C Unit Min Typ Max Min Typ Max Min Typ Max IEE Power Supply Current 33 40 33 40 38 46 mA VOH Output HIGH Voltage (Note 2) −1025 −950 −880 −1025 −950 −880 −1025 −950 −880 mV VOL Output LOW Voltage (Note 2) −1810 −1705 −1620 −1810 −1745 −1620 −1810 −1740 −1620 mV VIH Input HIGH Voltage −1165 −1025 −880 −1165 −1025 −880 −1165 −1025 −880 mV VIL Input LOW Voltage −1810 −1645 −1475 −1810 −1645 −1475 −1810 −1645 −1475 mV IIH Input HIGH Current D SEL 200 150 200 150 200 150 mA IIL Input LOW Current 0.5 0.3 0.5 0.25 0.5 0.2 mA NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit values are applied individually under normal operating conditions and not valid simultaneously. 1. Input and output parameters vary 1:1 with VCC. VEE can vary −0.46 V / +0.8 V. 2. Outputs are terminated through a 50 W resistor to VCC − 2.0 V. Table 8. AC CHARACTERISTICS (VCCx = 5.0 V; VEE = 0.0 V or VCCx = 0.0 V; VEE = −5.0 V (Note 1)) Symbol Characteristic 0°C 25°C 85°C Unit Min Typ Max Min Typ Max Min Typ Max fMAX Maximum Toggle Frequency 700 1100 700 1100 700 1100 MHz tPLH tPHL Propagation Delay to Output D SEL 250 450 500 700 650 825 250 450 500 700 650 825 250 450 500 700 650 825 ps tSKEW Within-Device Skew (Note 2) 60 60 60 ps tJITTER Random Clock Jitter (RMS) < 1 < 1 < 1 ps tr tf Rise/Fall Time (20 - 80%) 275 425 650 275 425 650 275 425 650 ps NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit values are applied individually under normal operating conditions and not valid simultaneously. 1. 10 Series: VEE can vary −0.46 V / +0.06 V. 100 Series: VEE can vary −0.46 V / +0.8 V. 2. Within-device skew is defined as identical transitions on similar paths through a device. |
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