HCF4029B datasheet(8/12 Pages) STMICROELECTRONICS

No. de pieza	HCF4029B

Descripción Electrónicos	PRESETTABLE UP/DOWN COUNTER BINARY OR BCD DECADE

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Fabricante Electrónico	STMICROELECTRONICS [STMicroelectronics]

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HCF4029B

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(*) Typical temperature coefficient for all VDD value is 0.3 %/°C.

(1) If more than one unit is cascated in the parallel clocked application tr should be made less than or equal to the sum of the fixed propagation

delay at 15pF and the transition time of the carry output driving stage for the estimated capacitance load.

(2) From Up/Down, Binary/Decade, Carry In or Preset Enable Control Inputs to Clock Edge.

(3) From Carry In to Clock Edge.

TEST CIRCUIT

CL = 50pF or equivalent (includes jig and probe capacitance)

RL = 200KΩ

RT = ZOUT of pulse generator (typically 50Ω)

PRESET ENABLE

tPHL tPLH Propagation Delay Time

(Carry Output)

5

170

340

ns

10

70

140

15

50

100

tsetup

(3)

Minimum Setup Time

(Carry In)

525

50

ns

10

15

30

15

12

25

thold

Minimum Hold Time

(Carry In)

5

100

200

ns

10

35

70

15

30

60

Symbol

Parameter

Test Condition

Value (*)

Unit

VDD (V)

Min.

Typ.

Max.

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HCF4029B Datasheet(PDF) 8 Page - STMicroelectronics

HCF4029B Datasheet(HTML) 8 Page - STMicroelectronics

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