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ADATE302-02BSVZ Datasheet(PDF) 1 Page - Analog Devices |
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ADATE302-02BSVZ Datasheet(HTML) 1 Page - Analog Devices |
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1 / 59 page  500 MHz Dual Integrated DCL with Differential Drive/Receive, Level Setting DACs, and Per Pin PMU ADATE302-02 Rev. A Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibilityis assumedbyAnalog Devices foritsuse,nor for anyinfringements ofpatents orother rightsofthirdpartiesthatmayresultfromitsuse.Specificationssubjecttochangewithoutnotice.No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarksandregisteredtrademarksarethepropertyoftheirrespectiveowners. One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 ©2008–2009 Analog Devices, Inc. All rights reserved. FEATURES Driver 3-level driver with high-Z mode and built-in clamps Precision trimmed output resistance Low leakage mode (typically <10 nA) Voltage range: −2.0 V to +6.0 V 1.0 ns minimum pulse width, 1 V terminated Comparator Window and differential comparator >1 GHz input equivalent bandwidth Load ±12 mA maximum current capability Per pin PMU Force voltage range: −2.0 V to +6.0 V 5 current ranges: 25 mA, 2 mA, 200 μA, 20 μA, and 2 μA Levels 14-bit DAC for DCL levels Typically <±5 mV INL (calibrated) 16-bit DAC for PMU levels Typically <±1.5 mV INL (calibrated) linearity in FV mode HVOUT output buffer 0 V to 13.5 V output range Packages 84-ball, 9 mm × 9 mm, flip-chip BGA 100-lead TQFP_EP 1.7 W per channel with no load APPLICATIONS Automatic test equipment Semiconductor test systems Board test systems Instrumentation and characterization equipment GENERAL DESCRIPTION The ADATE302-02 is a complete, single-chip solution that performs the pin electronic functions of the driver, the compa- rator, and the active load (DCL), per pin PMU, and dc levels for ATE applications. The device also contains an HVOUT driver with a VHH buffer capable of generating up to 13.5 V. The driver features three active states: data high mode, data low mode, and term mode, as well as an inhibit state. The inhibit state, in conjunction with the integrated dynamic clamp, facilitates the implementation of a high speed active termination. The output voltage range is −2.0 V to +6.0 V to accommodate a wide variety of test devices. The ADATE302-02 can be used as either a dual single-ended drive/receive channel or a single differential drive/receive channel. Each channel of the ADATE302-02 features a high speed window comparator for functional testing as well as a per pin PMU with FV or FI and MV or MI functions. All necessary dc levels for DCL functions are generated by on-chip 14-bit DACs. The per pin PMU features an on-chip 16-bit DAC for high accuracy and contains integrated range resistors to minimize external component counts. The ADATE302-02 uses a serial bus to program all functional blocks and has an on-board temperature sensor for monitoring the device temperature. |
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