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LMX2525LQ1321 Datasheet(PDF) 6 Page - National Semiconductor (TI) |
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LMX2525LQ1321 Datasheet(HTML) 6 Page - National Semiconductor (TI) |
6 / 17 page Electrical Characteristics (V IN = 2.8 V, refer to Typical Application Circuit; Limits in standard typeface are for TA = 25 ˚C; Limits in boldface type apply over the operating temperature range from -20 ˚C ≤ T A ≤ 75 ˚C unless otherwise noted.) (Continued) Symbol Parameter Condition Min Typ Max Units RF2 VCO FOR PDC800 Spurious Tones @ ≤ 25 kHz offset -45 dBc @ 25 kHz < offset ≤ 50 kHz -60 dBc @ 50 kHz < offset ≤ 100 kHz -69 dBc @ offset > 100 kHz -75 dBc DIGITAL INTERFACE (DATA, CLK, LE, LD, CE, BS) V IH High-Level Input Voltage 0.8 V CC V CC V 0.8 V DD V DD V V IL Low-Level Input Voltage -0.3 0.2 V CC V -0.3 0.2 V DD V I IH High-Level Input Current -10 10 µA I IL Low-Level Input Current -10 10 µA Input Capacitance 3 pF Rise/Fall Time 30 ns V OH High-Level Output Voltage V CC - 0.4 V V DD - 0.4 V V OL Low-Level Output Voltage 0.4 V Output Capacitance 5pF MICROWIRE INTERFACE TIMING t CS Data to Clock Set Up Time 50 ns t CH Data to Clock Hold Time 10 ns t CWH Clock Pulse Width HIGH 50 ns t CWL Clock Pulse Width LOW 50 ns t DS Latch Enable LOW to Data Set Up Time 50 ns t ES Clock to Latch Enable Set Up Time 50 ns t EW Latch Enable Pulse Width 50 ns Note 5: RF PLL and VCO in PDC800 mode. Note 6: RF PLL and VCO in PDC1500 mode. Note 7: The reference frequency must be programmed using the OSC_FREQ control bit. For other reference frequencies, please contact National Semiconductor. Note 8: For other frequency ranges, please contact National Semiconductor. Note 9: Lock time is defined as the time difference between the beginning of the frequency transition and the point at which the frequency remains within +/-1 kHz of the final frequency. Note 10: Lock time is defined as the time difference between the beginning of the frequency transition and the point at which the frequency remains within +/-3 kHz of the final frequency. Note 11: Lock time specification also applies to power up with MICROWIRE serial interface. Note 12: All limits are guaranteed. All electrical characteristics having room temperature limits are tested during production with TA = 25 ˚C or correlated using Statistical Quality Control (SQC) methods. All hot and cold limits are guaranteed by correlating the electrical characteristics to process and temperature variations and applying statistical process control. www.national.com 6 |
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