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ADR370ART-R2 Datasheet(PDF) 6 Page - Analog Devices

No. de pieza ADR370ART-R2
Descripción Electrónicos  Precision Low Power 2.048 V SOT-23 Voltage Reference
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ADR370ART-R2 Datasheet(HTML) 6 Page - Analog Devices

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REV. A
–6–
ADR370
PARAMETER DEFINITIONS
Temperature Coefficient
Temperature coefficient is the change of output voltage with
respect to operating temperature changes, normalized by the
output voltage at 25
°C. This parameter is expressed in ppm/°C
and can be determined with the following equation
TCV
ppm
C
VT
VT
VC
T
T
O
OO
O
°
 =
()()
°
()×−
()
×
21
21
6
25
10
(1)
where:
VO (25
°C) = V
O at 25
°C.
VO (T1) = VO at Temperature 1.
VO (T2) = VO at Temperature 2.
Line Regulation
Line regulation is the change in output voltage due to a specified
change in input voltage. This parameter accounts for the effects
of self-heating. Line regulation is expressed in either percent per
volt, parts-per-million per volt, or microvolts per volt change in
input voltage.
Load Regulation
Load regulation is the change in output voltage due to a specified
change in load current. This parameter accounts for the effects
of self-heating. Load regulation is expressed in either microvolts
per milliampere, parts-per-million per milliampere, or ohms of
dc output resistance.
Long Term Stability
Long term stability is the typical shift of output voltage at 25
°C
on a sample of parts subjected to a test of 1,000 hours at 25
°C.
VV
t
V
t
V
ppm
Vt
Vt
Vt
OO
O
O
OO
O
=
()()
[] = ()
()
()
×
01
01
0
6
10
(2)
where:
VO (T1) = VO at 25
°C at time 0.
VO (T2) = VO at 25
°C after 1,000 hours operation at 25°C.
Thermal Hysteresis
Thermal hysteresis is defined as the change of output voltage after
the device is cycled through temperature from +25
°C to –40°C
to +125
°C and back to +25°C. This is a typical value from a sample
of parts put through such a cycle.
VV
C
V
V
ppm
VC
V
VC
O
HYS
O
O TC
O
HYS
OO TC
O
__
_
_
()
[] =
°
()
°
()
×
25
25
25
10
6
(3)
where:
VO (25
°C) = VO at 25°C.
VO_TC = VO at 25
°C after temperature cycle at +25°C to –40°C
to +125
°C and back to +25°C.
THEORY OF OPERATION
The ADR370 uses the band-gap concept to produce a stable,
low temperature coefficient voltage reference suitable for high
accuracy data acquisition components and systems. This device
makes use of underlying temperature characteristics of a silicon
transistor’s base-emitter voltage (VBE) in the forward biased
operating region. Under this condition, all such transistors have
a –2 mV/
°C temperature coefficient (TC) and a V
BE that, when
extrapolated to absolute zero, 0 K, (with collector current pro-
portional to absolute temperature) approximates the silicon
band-gap voltage. By summing a voltage that has an equal and
opposite temperature coefficient of 2 mV/
°C with a V
BE of a
forward biased transistor, an almost zero TC reference can be
developed. The simplified circuit diagram in Figure 1 shows how
a compensating voltage, V1, is achieved by driving two transistors
at different current densities and amplifying the resultant VBE
difference (
∆V
BE, which has a positive TC). The sum (VBG) of VBE
and V1 is then buffered and amplified to produce a stable reference
voltage of 2.048 V at the output.
VIN
VOUT
GND
VDS
R5
R6
R4
R3
R2
R1
V1
Figure 1. Simplified Schematic
Applying the ADR370
In order to achieve the specified performance, two external
components should be used in conjunction with the ADR370,
a 4.7
µF capacitor and a 1 µF capacitor should be applied to the
input and output, respectively. Figure 2 shows the ADR370 with
both the input and output capacitors attached.
For further transient response optimization, an additional 0.1
µF
capacitor in parallel with the 4.7
µF input capacitor can be used.
A 1
µF output capacitor will provide stable performance for all
loading conditions. The ADR370 can, however, operate under
low (–100
µA < I
OUT < +100
µA) current conditions with just a
0.2
µF output capacitor and a 1 µF input capacitor.
CIN
VIN
ADR370
GND
4.7 F
COUT
VOUT
1 F
Figure 2. Typical Connection Diagram


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