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SST89E516RD2-40-C-TQJ Datasheet(PDF) 71 Page - Silicon Storage Technology, Inc |
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SST89E516RD2-40-C-TQJ Datasheet(HTML) 71 Page - Silicon Storage Technology, Inc |
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71 / 91 page  Preliminary Specifications FlashFlex51 MCU SST89E52RD2 / SST89E54RD2 / SST89E58RD2 / SST89E516RD2 SST89V52RD2 / SST89V54RD2 / SST89V58RD2 / SST89V516RD2 71 ©2004 Silicon Storage Technology, Inc. S71255-00-000 3/04 1. Under steady state (non-transient) conditions, IOL must be externally limited as follows: Maximum IOL per port pin: 15mA Maximum IOL per 8-bit port:26mA Maximum IOL total for all outputs:71mA If IOL exceeds the test condition, VOL may exceed the related specification. Pins are not guaranteed to sink current greater than the listed test conditions. 2. Capacitive loading on Ports 0 & 2 may cause spurious noise to be superimposed on the VOLs of ALE and Ports 1 & 3. The noise due to external bus capacitance discharging into the Port 0 & 2 pins when the pins make 1-to-0 transitions during bus operations. In the worst cases (capacitive loading > 100pF), the noise pulse on the ALE pin may exceed 0.8V. In such cases, it may be desirable to qualify ALE with a Schmitt Trigger, or use an address latch with a Schmitt Trigger STROBE input. 3. Load capacitance for Port 0, ALE & PSEN#= 100pF, load capacitance for all other outputs = 80pF. 4. Capacitive loading on Ports 0 & 2 may cause the VOH on ALE and PSEN# to momentarily fall below the VDD - 0.7 specification when the address bits are stabilizing. 5. Pins of Ports 1, 2 & 3 source a transition current when they are being externally driven from 1 to 0. The transition current reaches its maximum value when VIN is approximately 2V. 6. Pin capacitance is characterized but not tested. EA# is 25pF (max). |
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