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74ACT125PCQB Datasheet(Hoja de datos) 3 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
No. de Pieza. 74ACT125PCQB
Descripción  Quad Buffer with TRI-STATE Outputs
Descarga  8 Pages
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Fabricante  NSC [National Semiconductor (TI)]
Página de inicio  http://www.national.com
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DC Characteristics for ’AC Family Devices (Continued)
74AC
54AC
74AC
Symbol
Parameter
VCC
TA ea25 C
TA e
TA e
Units
Conditions
(V)
b
55 Cto a125 C
b
40 Cto a85 C
Typ
Guaranteed Limits
IOZ
Maximum TRI-STATE
VI (OE) e VIL VIH
Current
55
g
05
g
100
g
50
m
AVI e VCC VGND
VO e VCC GND
IOLD
Minimum Dynamic
55
50
75
mA
VOLD e 165V Max
IOHD
Output Current
55
b
50
b
75
mA
VOHD e 385V Min
ICC
Maximum Quiescent
55
40
800
400
m
A
VIN e VCC
Supply Current
or GND
Maximum test duration 20 ms one output loaded at a time
Note
IIN and ICC
30V are guaranteed to be less than or equal to the respective limit
55V VCC
ICC for 54AC
25 C is identical to 74AC
25 C
DC Characteristics for ’ACT Family Devices
74ACT
74ACT
Symbol
Parameter
VCC
TA ea25 C
TA e
Units
Conditions
(V)
b
40 Cto a85 C
Typ
Guaranteed Limits
VIH
Minimum High Level
45
15
20
20
V
VOUT e 01V
Input Voltage
55
15
20
20
or VCC b 01V
VIL
Maximum Low Level
45
15
08
08
V
VOUT e 01V
Input Voltage
55
15
08
08
or VCC b 01V
VOH
Minimum High Level
45
449
44
44
V
IOUT eb50 mA
Output Voltage
55
549
54
54
VIN e VIL or VIH
45
386
376
VIOH
b
24 mA
55
486
476
b
24 mA
VOL
Maximum Low Level
45
0001
01
01
V
IOUT e 50 mA
Output Voltage
55
0001
01
01
VIN e VIL or VIH
45
036
044
VIOL
24 mA
55
036
044
24 mA
IIN
Maximum Input Leakage Current
55
g
01
g
10
m
AVI e VCC GND
IOZ
Maximum TRI-STATE
55
g
05
g
50
m
A
VI e VIL VIH
Current
VO e VCC GND
ICCT
Maximum ICC Input
55
06
15
mA
VI e VCC b 21V
IOLD
Minimum Dynamic
55
75
mA
VOLD e 165V Max
IOHD
Output Current
55
b
75
mA
VOHD e 385V Min
ICC
Maximum Quiescent
55
40
400
m
A
VIN e VCC
Supply Current
or GND
All outputs loaded thresholds on input associated with output under test
Maximum test duration 20 ms one output loaded at a time
May be measured per the JEDEC Alternate Method
3




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