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74F175AD Datasheet(PDF) 4 Page - NXP Semiconductors |
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74F175AD Datasheet(HTML) 4 Page - NXP Semiconductors |
4 / 10 page Philips Semiconductors Product specification 74F175A Quad D flip-flop 1996 Mar 12 4 RECOMMENDED OPERATING CONDITIONS SYMBOL PARAMETER LIMITS UNIT MIN NOM MAX VCC Supply voltage 4.5 5.0 5.5 V VIH High-level input voltage 2.0 V VIL Low-level input voltage 0.8 V IIK Input clamp current –18 mA IOH High-level output current –1 mA IOL Low-level output current 20 mA T b Operating free air temperature range Commercial range 0 +70 °C Tamb Operating free air temperature range Industrial range –40 +85 °C DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL PARAMETER TEST LIMITS UNIT CONDITIONS1 MIN TYP2 MAX VOH High-level output voltage VCC= MIN, VIL = MAX, "10%VCC 2.5 V VOH High-level out ut voltage CC IL VIH = MIN, IOH = MAX "5%VCC 2.7 3.4 V VOL Low-level output voltage VCC = MIN, VIL = MAX, "10%VCC 0.30 0.5 V CC IL VIH = MIN, IOL = MAX "5%VCC 0.30 0.5 V VIK Input clamp voltage VCC = MIN, II = IIK –0.73 –1.2 V II Input current at maximum input voltage VCC = 0.0V, VI = 7.0V 100 µA IIH High-level input current VCC = MAX, VI = 2.7V 20 µA IIL Low-level input current VCC = MAX, VI = 0.5V 74F175A –20 µA IOS Short-circuit output current3 VCC = MAX –60 –150 mA ICC Supply current (total) VCC = MAX 74F175A 22 31 mA Notes to DC electrical characteristics 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. AC ELECTRICAL CHARACTERISTICS FOR 74F175A LIMITS Tamb = 25°C Tamb = 0°C to +70°C Tamb = *40°C to +85°C SYMBOL PARAMETER TEST VCC = +5V VCC = +5.0V ± 10% VCC = +5.0V ± 10% UNIT CONDITION CL = 50pF, RL = 500Ω CL = 50pF, RL = 500Ω CL = 50pF, RL = 500Ω MIN TYP MAX MIN MAX MIN MAX fmax Maximum clock frequency Waveform 1 140 160 125 110 MHz tPLH tPHL Propagation delay CP to Qn or Qn Waveform 1 3.0 4.5 4.0 6.0 6.5 8.5 2.5 4.0 7.5 9.0 2.5 4.0 8.0 10.0 ns tPLH tPHL Propagation delay MR to Qn Waveform 3 4.5 6.5 9.0 4.5 10.0 4.5 11.0 ns tPHL tPHL Propagation delay MR to Qn Waveform 3 4.5 6.0 8.0 4.0 9.0 4.0 10.0 ns |
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