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NB3N3001 Datasheet(PDF) 2 Page - ON Semiconductor

No. de Pieza. NB3N3001
Descripción  3.3 V 106.25 MHz/ 212.5 MHz PureEdge Clock Generator with LVPECL Differential Output
Descarga  8 Pages
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Fabricante  ONSEMI [ON Semiconductor]
Página de inicio  http://www.onsemi.com
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NB3N3001 Datasheet(HTML) 2 Page - ON Semiconductor

   
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NB3N3001
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Figure 2. Pinout (Top View)
Q
1
2
3
4
8
7
6
5
VCCA
VEE
XOUT
XIN
VCC
Q
FSEL
NB3N3001
FSEL
Output Frequency (MHz)
Table 1. Output Frequency Select
NOTE: Input crystal = 26.5625 MHz
106.25
0
212.5
1
Table 2. PIN DESCRIPTION
Pin
Symbol
Type
Description
1
VCCA
Power
Positive analog power supply pin. Connected to VCC with filter components (See Figure 8).
2
VEE
Power
Negative supply pin.
3
XOUT
Input
Crystal input (OUT).
4
XIN
Input
Crystal input (IN).
5
FSEL
LVTTL/LVCMOS
Input
Frequency select pin. Defaults LOW when left open. Internal pull down resistor to VEE.
6
Q
Output
Inverted differential output. Typically terminated with 50
W to VCC−2.0 V.
7
Q
Output
Noninverted differential output. Typically terminated with 50
W to VCC−2.0 V.
8
VCC
Power
Positive digital core power supply pin. Connected to 3.3 V.
Table 3. ATTRIBUTES
Characteristic
Value
ESD Protection
Human Body Model
Machine Model
> 6 kV
> 200 V
Moisture Sensitivity (Note 1)
Pb−Free Pkg, TSSOP−8
Level 3
Flammability Rating Oxygen Index: 28 to 34
UL 94 V−0 @ 0.125 in
Transistor Count
4150
Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
1. For additional information, see Application Note AND8003/D.
Table 4. MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
VCC
Supply Voltage
4.6
V
VI
Inputs
−0.5 to VCC + 0.5
V
IO
Output Current
Continuous
Surge
50
100
mA
qJA
Thermal Resistance (Junction−to−Ambient)
0 Lfpm
500 Lfpm
142
103
°C/W
TSTG
Storage Temperature
−65 to 150
°C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.


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