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ADN2865 Datasheet(PDF) 7 Page - Analog Devices

No. de pieza ADN2865
Descripción Electrónicos  Continuous Rate 12.3Mb/s to 2.7Gb/s Clock and Data Recovery IC w/Loop Timed SERDES
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Preliminary Technical Data
ADN2865
Rev. PrA | Page 7 of 33
ABSOLUTE MAXIMUM RATINGS
TA = TMIN to TMAX, VCC = VMIN to VMAX, VEE = 0 V, CF = 0.47
μF, SLICEP = SLICEN = VEE, unless otherwise noted.
Table 4.
Parameter
Rating
Supply Voltage (VCC)
4.2 V
Minimum Input Voltage (All Inputs)
VEE − 0.4 V
Maximum Input Voltage (All Inputs)
VCC + 0.4 V
Maximum Junction Temperature
125°C
Storage Temperature
−65°C to +150°C
Lead Temperature (Soldering 10 s)
300°C
Stress above those listed under Absolute Maximum Ratings may
cause permanent damage to the device. This is a stress rating
only and functional operation of the device at these or any other
conditions above those indicated in the operational sections of
this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
THERMAL CHARACTERISTICS
Thermal Resistance
56-LFCSP, 4-layer board with exposed paddle soldered to VEE
θJA = 28°C/W
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.


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