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CD54ACT05F3A Datasheet(PDF) 1 Page - Texas Instruments |
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CD54ACT05F3A Datasheet(HTML) 1 Page - Texas Instruments |
1 / 8 page www.ti.com FEATURES 1 2 3 4 5 6 7 14 13 12 11 10 9 8 1A 1Y 2A 2Y 3A 3Y GND VCC 6A 6Y 5A 5Y 4A 4Y CD54ACT05 . . . F PACKAGE CD74ACT05 . . . E OR M PACKAGE (TOP VIEW) DESCRIPTION/ORDERING INFORMATION Y A CD54ACT05 ,, CD74ACT05 HEX INVERTERS WITH OPEN-DRAIN OUTPUTS SCHS311C – JANUARY 2001 – REVISED JANUARY 2007 • Inputs Are TTL-Voltage Compatible • Speed of Bipolar F, AS, and S, With Significantly Reduced Power Consumption • Fanout to 15 F Devices • SCR-Latchup-Resistant CMOS Process and Circuit Design • Exceeds 2-kV ESD Protection Per MIL-STD-883, Method 3015 The 'ACT05 devices contain six independent inverters. These devices perform the Boolean function Y = A. The open-drain outputs require pullup resistors to perform correctly, and can be connected to other open-drain outputs to implement active-low wired-OR or active-high wired-AND functions. ORDERING INFORMATION TA PACKAGE(1) ORDERABLE PART NUMBER TOP-SIDE MARKING PDIP – E Tube of 25 CD74ACT05E CD74ACT05E Tube of 50 CD74ACT05M –55 °C to 125°C SOIC – M ACT05M Reel of 2500 CD74ACT05M96 CDIP – F Reel of 1000 CD54ACT05F3A CD54ACT05F3A (1) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at www.ti.com/sc/package. FUNCTION TABLE (EACH INVERTER) INPUT OUTPUT A Y H L L Z Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PRODUCTION DATA information is current as of publication date. Copyright © 2001–2007, Texas Instruments Incorporated Products conform to specifications per the terms of the Texas On products compliant to MIL-PRF-38535, all parameters are Instruments standard warranty. Production processing does not tested unless otherwise noted. On all other products, production necessarily include testing of all parameters. processing does not necessarily include testing of all parameters. |
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