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AD5821-WAFER Datasheet(PDF) 10 Page - Analog Devices |
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AD5821-WAFER Datasheet(HTML) 10 Page - Analog Devices |
10 / 16 page AD5821 Rev. 0 | Page 10 of 16 TERMINOLOGY Relative Accuracy For the DAC, relative accuracy or integral nonlinearity is a measurement of the maximum deviation, in LSB, from a straight line passing through the endpoints of the DAC transfer function. A typical INL vs. code plot is shown in Figure 5. Differential Nonlinearity (DNL) Differential nonlinearity is the difference between the measured change and the ideal 1 LSB change between any two adjacent codes. A specified differential nonlinearity of ±1 LSB maximum ensures monotonicity. This DAC is guaranteed monotonic by design. A typical DNL vs. code plot is shown in Figure 6. Zero-Code Error Zero-code error is a measurement of the output error when zero code (0x0000) is loaded to the DAC register. Ideally, the output is 0 mA. The zero-code error is always positive in the AD5821 because the output of the DAC cannot go below 0 mA. This is due to a combination of the offset errors in the DAC and output amplifier. Zero-code error is expressed in milliamperes (mA). Gain Error Gain error is a measurement of the span error of the DAC. It is the deviation in slope of the DAC transfer characteristic from the ideal, expressed as a percent of the full-scale range. Gain Error Drift Gain error drift is a measurement of the change in gain error with changes in temperature. It is expressed in LSB/°C. Digital-to-Analog Glitch Impulse This is the impulse injected into the analog output when the input code in the DAC register changes state. It is normally specified as the area of the glitch in nanoamperes per second (nA-s) and is measured when the digital input code is changed by 1 LSB at the major carry transition. Digital Feedthrough Digital feedthrough is a measurement of the impulse injected into the analog output of the DAC from the digital inputs of the DAC, but it is measured when the DAC output is not updated. It is specified in nanoamperes per second (nA-s) and measured with a full-scale code change on the data bus, that is, from all 0s to all 1s and vice versa. Offset Error Offset error is a measurement of the difference between ISINK (actual) and IOUT (ideal) in the linear region of the transfer function, expressed in milliamperes (mA). Offset error is measured on the AD5821 with Code 16 loaded into the DAC register. Offset Error Drift Offset error drift is a measurement of the change in offset error with a change in temperature. It is expressed in microvolts per degree Celsius (μV/°C). |
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