MC74LVXT4051MG datasheet(3/14 Pages) ONSEMI

No. de pieza	MC74LVXT4051MG

Descripción Electrónicos	Analog Multiplexer/Demultiplexer High?뭁erformance Silicon?묰ate CMOS

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Fabricante Electrónico	ONSEMI [ON Semiconductor]

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MC74LVXT4051

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MAXIMUM RATINGS

Symbol

Parameter

Value

Unit

VEE

Negative DC Supply Voltage

(Referenced to GND)

*7.0 to )0.5

V

VCC

Positive DC Supply Voltage

(Referenced to GND)

(Referenced to VEE)

*0.5 to )7.0

V

VIS

Analog Input Voltage

VEE

*0.5 to V

CC )0.5

V

VIN

Digital Input Voltage

(Referenced to GND)

*0.5 to 7.0

V

I

DC Current, Into or Out of Any Pin

$20

mA

TSTG

Storage Temperature Range

*65 to )150

_C

TL

Lead Temperature, 1 mm from Case for 10 Seconds

260

_C

TJ

Junction Temperature under Bias

)150

_C

qJA

Thermal Resistance

SOIC

TSSOP

143

164

°C/W

PD

Power Dissipation in Still Air,

SOIC

TSSOP

500

450

mW

MSL

Moisture Sensitivity

Level 1

FR

Flammability Rating

Oxygen Index: 30% − 35%

UL 94−V0 @ 0.125 in

VESD

ESD Withstand Voltage

Human Body Model (Note 1)

Machine Model (Note 2)

Charged Device Model (Note 3)

u2000

u200

u1000

V

ILATCHUP

Latchup Performance

Above VCC and Below GND at 125°C (Note 4)

$300

mA

Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit

values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,

damage may occur and reliability may be affected.

1. Tested to EIA/JESD22−A114−A.

2. Tested to EIA/JESD22−A115−A.

3. Tested to JESD22−C101−A.

4. Tested to EIA/JESD78.

RECOMMENDED OPERATING CONDITIONS

Symbol

Parameter

Min

Max

Unit

VEE

Negative DC Supply Voltage

(Referenced to GND)

*6.0

GND

V

VCC

Positive DC Supply Voltage

(Referenced to GND)

(Referenced to VEE)

2.5

6.0

V

VIS

Analog Input Voltage

VEE

VCC

V

VIN

Digital Input Voltage

(Note 5) (Referenced to GND)

0

6.0

V

TA

Operating Temperature Range, All Package Types

*55

125

_C

tr, tf

Input Rise/Fall Time

VCC = 3.0 V $ 0.3 V

(Channel Select or Enable Inputs)

VCC = 5.0 V $ 0.5 V

0

100

20

ns/V

5. Unused inputs may not be left open. All inputs must be tied to a high−logic voltage level or a low−logic input voltage level.

DEVICE JUNCTION TEMPERATURE VERSUS

TIME TO 0.1% BOND FAILURES

Junction

Temperature

°C

Time, Hours

Time, Years

80

1,032,200

117.8

90

419,300

47.9

100

178,700

20.4

110

79,600

9.4

120

37,000

4.2

130

17,800

2.0

140

8,900

1.0

1

10

100

1000

FAILURE RATE OF PLASTIC = CERAMIC

UNTIL INTERMETALLICS OCCUR

Figure 3. Failure Rate vs. Time Junction Temperature

TIME, YEARS

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MC74LVXT4051MG Datasheet(PDF) 3 Page - ON Semiconductor

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