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CAT28F020 Datasheet(PDF) 3 Page - Catalyst Semiconductor

No. de pieza CAT28F020
Descripción Electrónicos  2 Megabit CMOS Flash Memory
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Fabricante Electrónico  CATALYST [Catalyst Semiconductor]
Página de inicio  http://www.catalyst-semiconductor.com
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CAT28F020 Datasheet(HTML) 3 Page - Catalyst Semiconductor

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CAT28F020
3
Doc. No. 1029, Rev. C
CAPACITANCE TA = 25°C, f = 1.0 MHz
Symbol
Test
Conditions
Min
Typ
Max
Units
CIN(3)
Input Pin Capacitance
VIN = 0V
6
pF
COUT(3)
Output Pin Capacitance
VOUT = 0V
10
pF
CVPP(3)
VPP Supply Capacitance
VPP = 0V
25
pF
ABSOLUTE MAXIMUM RATINGS*
Temperature Under Bias ................... –55
°C to +95°C
Storage Temperature ....................... –65
°C to +150°C
Voltage on Any Pin with
Respect to Ground(1) ........... –2.0V to +VCC + 2.0V
Voltage on Pin A9 with
Respect to Ground(1) ................... –2.0V to +13.5V
VPP with Respect to Ground
during Program/Erase(1) .............. –2.0V to +14.0V
VCC with Respect to Ground(1) ............ –2.0V to +7.0V
Package Power Dissipation
Capability (TA = 25
°C) .................................. 1.0 W
Lead Soldering Temperature (10 secs) ............ 300
°C
Output Short Circuit Current(2) ........................ 100 mA
RELIABILITY CHARACTERISTICS
Symbol
Parameter
Test Method
Min
Typ
Max
Units
NEND(3)
Endurance
MIL-STD-883, Test Method 1033
100K
Cycles/Byte
TDR(3)
Data Retention
MIL-STD-883, Test Method 1008
10
Years
VZAP(3)
ESD Susceptibility
MIL-STD-883, Test Method 3015
2000
Volts
ILTH(3)(4)
Latch-Up
JEDEC Standard 17
100
mA
Note:
1. The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC
voltage on output pins is VCC +0.5V, which may overshoot to VCC + 2.0V for periods of less than 20ns.
2. Output shorted for no more than one second. No more than one output shorted at a time.
3. This parameter is tested initially and after a design or process change that affects the parameter.
4. Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to VCC +1V.
*COMMENT
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation of
the device at these or any other conditions outside of those
listed in the operational sections of this specification is not
implied. Exposure to any absolute maximum rating for
extended periods may affect device performance and
reliability.


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