Analog Integrated Circuit Device Data

Freescale Semiconductor

9

33797

ELECTRICAL CHARACTERISTICS

STATIC ELECTRICAL CHARACTERISTICS

RST INPUT PIN (ACTIVE LOW) (11)

System Reset Threshold

–

–

4.1

V

Internal Current Pull-Down

-6

-10

-15

µA

RST Logic Low Level

0.0

2.5

V

RST Logic High Level

2.5

V

SQUIB DIAGNOSTICS ($D0–$D3 COMMANDS) (12)

Diagnostic Current Through Squib (13)

30

34

40.5

mA

Resistance Threshold 1 (13)

1.2

1.4

1.6

Ω

Resistance Threshold 2 (13)

1.6

1.8

2.1

Ω

Resistance Threshold 3 (13)

2.1

2.4

2.6

Ω

Resistance Threshold 4 (13)

2.6

2.9

3.2

Ω

Resistance Threshold 5 (13)

3.3

3.7

4.4

Ω

Resistance Threshold 6 (13)

4.6

5.4

6.0

Ω

Resistance Threshold 7 (13)

5.7

6.5

7.1

Ω

Resistance Threshold 8 (13)

6.7

7.8

8.5

Ω

SQUIB SHORT-TO-BATTERY/GROUND DIAGNOSTICS AND SQUIB HARNESS SHORT-TO-BATTERY/GROUND DIAGNOSTICS WITH

AN OPEN SQUIB ($C1, $C3 COMMANDS)

7.0 V

≤ V

5.7

6.0

6.4

V

Voltage Threshold for SQB_LO and SQB_HI Shorted to Ground

7.0 V

≤ V

1.3

1.4

1.6

V

Current Sink Shorts Measurements I_SQB_LO_XX (14)

1.0 V

≤ SENSE_XX ≤ 16 V, Typical = 800 µA

-500

-800

-900

µA

Current Source Shorts Measurements I_SQB_HI_XX (14)

1.0 V

≤ SENSE_XX ≤ 16 V, 7.0 V ≤ V

1.7

3.5

3.7

mA

Squib using $C3 Command

5.75

–

6.75

V

Notes

11

12

By changing the R_DIAG resistor value, the resistance thresholds can be varied in a linear relationship.The R_DIAG resistance can be

changed by ±10% to shift the thresholds by ±10%. Design goal for resistance threshold change is ±15%. R_DIAG threshold limit may

have to be changed to accommodate ±15% change. Example: Shifting the R_DIAG resistance value ±10%, the resistance threshold

will change by ±10%. Refer to Table 4, page 12.

13

14

XX = 1A, 1B, 2A, or 2B.

Table 3. Static Electrical Characteristics (continued)

Characteristic

Symbol

Min

Typ

Max

Unit