Motor de Búsqueda de Datasheet de Componentes Electrónicos
  Spanish  ▼
ALLDATASHEET.ES

X  

SN74BCT8244ADW Datasheet(PDF) 11 Page - Texas Instruments

Click here to check the latest version.
No. de pieza SN74BCT8244ADW
Descripción Electrónicos  SCAN TEST DEVICES WITH OCTAL BUFFERS
Download  28 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
Fabricante Electrónico  TI [Texas Instruments]
Página de inicio  http://www.ti.com
Logo TI - Texas Instruments

SN74BCT8244ADW Datasheet(HTML) 11 Page - Texas Instruments

Back Button SN74BCT8244ADW Datasheet HTML 7Page - Texas Instruments SN74BCT8244ADW Datasheet HTML 8Page - Texas Instruments SN74BCT8244ADW Datasheet HTML 9Page - Texas Instruments SN74BCT8244ADW Datasheet HTML 10Page - Texas Instruments SN74BCT8244ADW Datasheet HTML 11Page - Texas Instruments SN74BCT8244ADW Datasheet HTML 12Page - Texas Instruments SN74BCT8244ADW Datasheet HTML 13Page - Texas Instruments SN74BCT8244ADW Datasheet HTML 14Page - Texas Instruments SN74BCT8244ADW Datasheet HTML 15Page - Texas Instruments Next Button
Zoom Inzoom in Zoom Outzoom out
 11 / 28 page
background image
SN54BCT8244A, SN74BCT8244A
SCAN TEST DEVICES
WITH OCTAL BUFFERS
SCBS042E – FEBRUARY 1990 – REVISED JULY 1996
11
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
control boundary to high impedance
This instruction conforms to the IEEE Standard 1149.1a-1993 HIGHZ instruction. The bypass register is
selected in the scan path. A logic 0 value is captured in the bypass register during Capture-DR. The device
operates in a modified test mode in which all device output terminals are placed in the high-impedance state,
the device input terminals remain operational, and the normal on-chip logic function is performed.
control boundary to 1/0
This instruction conforms to the IEEE Standard 1149.1a-1993 CLAMP instruction. The bypass register is
selected in the scan path. A logic 0 value is captured in the bypass register during Capture-DR. Data in the input
BSCs is applied to the inputs of the normal on-chip logic, while data in the output BSCs is applied to the device
output terminals. The device operates in the test mode.
boundary run test
The bypass register is selected in the scan path. A logic 0 value is captured in the bypass register during
Capture-DR. The device operates in the test mode. The test operation specified in the BCR is executed during
Run-Test/Idle. The four test operations decoded by the BCR are: sample inputs/toggle outputs (TOPSIP),
PRPG, PSA, and simultaneous PSA and PRPG (PSA/PRPG).
boundary read
The BSR is selected in the scan path. The value in the BSR remains unchanged during Capture-DR. This
instruction is useful for inspecting data after a PSA operation.
boundary self test
The BSR is selected in the scan path. All BSCs capture the inverse of their current values during Capture-DR.
In this way, the contents of the shadow latches may be read out to verify the integrity of both shift-register and
shadow-latch elements of the BSR. The device operates in the normal mode.
boundary toggle outputs
The bypass register is selected in the scan path. A logic 0 value is captured in the bypass register during
Capture-DR. Data in the shift register elements of the selected output BSCs is toggled on each rising edge of
TCK in Run-Test/Idle and is then updated in the shadow latches and applied to the associated device output
terminals on each falling edge of TCK in Run-Test/Idle. Data in the selected input BSCs remains constant and
is applied to the inputs of the normal on-chip logic. Data appearing at the device input terminals is not captured
in the input BSCs. The device operates in the test mode.
boundary-control-register scan
The BCR is selected in the scan path. The value in the BCR remains unchanged during Capture-DR. This
operation must be performed before a boundary-run test operation to specify which test operation is to
be executed.


Número de pieza similar - SN74BCT8244ADW

Fabricante ElectrónicoNo. de piezaDatasheetDescripción Electrónicos
logo
Texas Instruments
SN74BCT8244ADW TI-SN74BCT8244ADW Datasheet
472Kb / 26P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUFFERS
SN74BCT8244ADW TI-SN74BCT8244ADW Datasheet
642Kb / 28P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUFFERS
SN74BCT8244ADWE4 TI-SN74BCT8244ADWE4 Datasheet
472Kb / 26P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUFFERS
SN74BCT8244ADWE4 TI-SN74BCT8244ADWE4 Datasheet
642Kb / 28P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUFFERS
SN74BCT8244ADWG4 TI-SN74BCT8244ADWG4 Datasheet
642Kb / 28P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUFFERS
More results

Descripción similar - SN74BCT8244ADW

Fabricante ElectrónicoNo. de piezaDatasheetDescripción Electrónicos
logo
Texas Instruments
SN54BCT8244A TI-SN54BCT8244A Datasheet
472Kb / 26P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUFFERS
SN54BCT8244A TI-SN54BCT8244A_08 Datasheet
642Kb / 28P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUFFERS
SN54BCT8240A TI-SN54BCT8240A Datasheet
473Kb / 26P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS
SN54BCT8245A TI-SN54BCT8245A Datasheet
309Kb / 22P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN54ABT8245 TI-SN54ABT8245_07 Datasheet
635Kb / 30P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN54BCT8245A TI-SN54BCT8245A_08 Datasheet
658Kb / 29P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN54ABT8245 TI-SN54ABT8245_08 Datasheet
665Kb / 30P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN54ABT8245 TI-SN54ABT8245 Datasheet
364Kb / 25P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN54ABT8245 TI-SN54ABT8245_06 Datasheet
483Kb / 28P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN54ABT8543 TI-SN54ABT8543 Datasheet
357Kb / 25P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS
More results


Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28


Datasheet Descarga

Go To PDF Page


Enlace URL




Política de Privacidad
ALLDATASHEET.ES
¿ALLDATASHEET es útil para Ud.?  [ DONATE ] 

Todo acerca de Alldatasheet   |   Publicidad   |   Contáctenos   |   Política de Privacidad   |   Intercambio de Enlaces   |   Lista de Fabricantes
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com